Markku Moilanen

Current State of the Mixed-Signal Test Bus 1149.4

Juha Häkkinen, Heli Jantunen, Jari Hannu, 2012, J. Electron. Test..

A frequency mixing and sub-sampling based RF-measurement apparatus for IEEE 1149.4

Juha Häkkinen, Juha-Veikko Voutilainen, Markku Moilanen, 2004, 2004 International Conferce on Test.

A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture

Heli Jantunen, Juha-Veikko Voutilainen, Markku Moilanen, 2009, Microelectron. J..

IEEE 1149.4 compatible ABMs for basic RF measurements [analogue boundary modules]

Juha Häkkinen, Markku Moilanen, Pekka Syri, 2005, Design, Automation and Test in Europe.

Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture

Juha Häkkinen, Jari Hannu, Markku Moilanen, 2010, J. Electron. Test..

Methods of Testing Discrete Semiconductors in the 1149.4 Environment

Jari Hannu, Markku Moilanen, J. Hannu, 2007, J. Electron. Test..

OPTOELECTRONICS AND MEASUREMENTS GROUP (OPME)

Aarne Mämmelä, Harri Kopola, Markku Moilanen, 2003 .

Solder interconnection failure time estimation based on the embedded precursor behaviour modelling

Juha Häkkinen, Juha-Veikko Voutilainen, Markku Moilanen, 2011, Microelectron. Reliab..

Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment

Markku Moilanen, Teuvo Saikkonen, 2007, J. Electron. Test..