S. Takeda

发表

Crystallinity estimation of thin silicon-on-insulator layers by means of diffractometry using a highly parallel X-ray microbeam.

A. Ogura, Y. Kagoshima, Y. Tsusaka, 2006, Journal of synchrotron radiation.

Synthesis of submicron metastable phase of silicon using femtosecond laser-driven shock wave

Kojiro F. Kobayashi, M. Okoshi, O. Sakata, 2011 .

Evaluation of lattice strain in silicon substrate beneath aluminum conductor film using high-resolution X-ray microbeam diffractometry

Y. Kagoshima, Y. Tsusaka, J. Matsui, 2002 .

Hyogo beamline at SPring-8: multiple station beamline with the TROIKA concept

Y. Kagoshima, Y. Tsusaka, J. Matsui, 2001 .

Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8

Y. Kagoshima, Y. Tsusaka, J. Matsui, 2001 .

Structural analysis of ELO‐GaN grown on a sapphire substrate as the underlying layer of a GaN‐based laser diode

M. Ikeda, Y. Kudo, Y. Tsusaka, 2007 .

Modified linear combination fitting for large-area two-dimensional chemical state mapping

Tetsuo Nagami, M. Tabuchi, S. Takeda, 2020 .

New Analytical Methods for the Surface/ Interface and the Micro-Structures in Advanced Nanocomposite Materials by Synchrotron Radiation

K. Nakamae, J. Matsui, S. Takeda, 2010 .

Preparation of lanthanum silicate electrolyte with high conductivity and high chemical stability

H. Takano, T. Yazawa, A. Mineshige, 2018, Solid State Ionics.

Local strain in SiGe/Si heterostructures analyzed by X-ray microdiffraction

N. Taoka, S. Kimura, O. Nakatsuka, 2006 .

X-ray topography using the forward transmitted beam under multiple-beam diffraction conditions.

H. Takano, Y. Kagoshima, Y. Tsusaka, 2016, The Review of scientific instruments.

High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy

H. Kimura, S. Kimura, Y. Kagoshima, 2000 .

Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO 2 /Si substrates

H. Komatsu, Y. Kagoshima, Y. Tsusaka, 2010 .

Estimation of bonded silicon-on-insulator wafers by means of diffractometry using a parallel X-ray microbeam

Y. Kagoshima, Y. Tsusaka, J. Matsui, 2003 .

Phase-Contrast X-Ray Imaging Using Both Vertically and Horizontally Expanded Synchrotron Radiation X-Rays with Asymmetric Bragg Reflection

Y. Kagoshima, Y. Tsusaka, J. Matsui, 1999 .

Development of High-Angular-Resolution Microdiffraction System for Reciprocal Space Map Measurements

O. Sakata, S. Kimura, A. Sakai, 2006 .

Evaluation of a-type screw dislocations in m-GaN film by means of X-ray diffractometry

S. Shibata, Y. Kagoshima, Y. Tsusaka, 2015 .

Formation of Amorphous Graded Structure in Bi3Pb7 Intermetallic Compounds under Strong Gravitational Field

K. Hiraga, M. Ono, S. Okayasu, 2009 .

Structure analysis of ELO‐GaN using a 2 × 4 μm2 micro‐beam X‐ray of an 8‐GeV storage ring

Y. Tsusaka, J. Matsui, S. Tomiya, 2003 .

Structural analysis of ELO-GaN grown on sapphire using the x-ray micro-beam of an 8-GeV storage ring

M. Ikeda, Y. Kudo, Y. Tsusaka, 2005 .