J L Lagos

Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave—Part II: Analysis and Validation

J L Lagos, F Fiori, 2011, IEEE Transactions on Electromagnetic Compatibility.

Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave—Part I: Modeling and Algorithm

F. Fiori, J L Lagos, F Fiori, 2011, IEEE Transactions on Electromagnetic Compatibility.