Raj P. Misra

Noise Spectral Density as a Diagnostic Tool for Reliability of p-n Junctions

R. P. Misra, Y. D. Kim, Raj P. Misra, 1969 .

Reliability prediction of solid dielectrics using electrical Noise as a screening parameter

R. P. Misra, V. Sundaresan, S. Pandey, 1991 .