Thomas N. Marieb

Stress-Induced Void Formation in Metal Lines

Paul R. Besser, Paul A. Flinn, Anne Sauter Mack, 1993 .

Direct observation of the growth and movement of electromigration voids under passivation

Paul A. Flinn, John C. Bravman, Michael C. Madden, 2008 .

High Resolution Observation of Void Motion in Passivated Metal Lines Under Electromigration Stress

Paul A. Flinn, Michael C. Madden, Thomas N. Marieb, 1992 .