K. LaBel

Risk Reduction for Use of Complex Devices in Space Projects

M. Friendlich, M. Berg, C. Poivey, 2007, IEEE Transactions on Nuclear Science.

Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA

S. Rezgui, J. McCollum, K. LaBel, 2012, IEEE Transactions on Nuclear Science.

NASA Electronic Parts and Packaging (NEPP) Program: assurance research on optoelectronics

M. Ott, K. LaBel, P. Marshall, 2005, SPIE Optics + Photonics.

Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices

Jonathan A. Pellish, Michael J. Campola, K. LaBel, 2015 .

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

B. Gilbert, K. LaBel, R. Krithivasan, 2005, IEEE Transactions on Nuclear Science.

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Jih-Jong Wang, M. Berg, K. LaBel, 2006, IEEE Transactions on Nuclear Science.

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

K. LaBel, C. Seidleck, J. Firer, 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.

Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

J. Boch, K. LaBel, R. Ecoffet, 2007, IEEE Transactions on Nuclear Science.

Effectiveness of internal vs. external SEU scrubbing mitigation strategies in a Xilinx FPGA: Design, test, and analysis

A. Lesea, C. Poivey, K. LaBel, 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.

Effects of Ion Species on SEB Failure Voltage of Power DMOSFET

N. Sukhaseum, C. Poivey, K. LaBel, 2011, IEEE Transactions on Nuclear Science.

Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates

K. LaBel, K. Kruckmeyer, Dakai Chen, 2011, IEEE Transactions on Nuclear Science.

A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop Applications

J. D. Cressler, A. Aude, K. LaBel, 2011, IEEE Transactions on Nuclear Science.

Characterization of transient error cross sections in high speed commercial fiber optic data links

R. Reed, K. LaBel, M.A. Carts, 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).