I. T. Yoon

Intrinsic carrier concentration of narrow‐gap mercury cadmium telluride based on the nonlinear temperature dependence of the band gap

Jeremiah R. Lowney, David G. Seiler, Chris L. Littler, 1992 .

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

Young Kuk, Chohui Kim, Y. Kuk, 2000 .