A. Gat

发表

The Effect of Thin Dielectric Films on the Accuracy of Pyrometric Temperature Measurement

A. Gat, D. W. Pettibone, J. R. Suarez, 1985 .

Pyrometric Emissivity Measurements and Compensation in an RTP Chamber

J. Nulman, A. Gat, J. Nulman, 1989 .

cw laser anneal of polycrystalline silicon: Crystalline structure, electrical properties

James F. Gibbons, Levy Gerzberg, T. J. Magee, 1978 .

Rapid thermal processing of thin gate dielectrics. Oxidation of silicon

J.P. Krusius, J. Nulman, J. Krusius, 1985, IEEE Electron Device Letters.