Colette Levade

Characterization and modelling of ageing failures on power MOSFET devices

Marc Legros, Patrick Tounsi, Benjamin Khong, 2007, Microelectron. Reliab..

Universal mechanisms of Al metallization ageing in power MOSFET devices

Marc Legros, Philippe Dupuy, Colette Levade, 2014, Microelectron. Reliab..

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue

Philippe Dupuy, Marc Legros, Patrick Tounsi, 2005, Microelectron. Reliab..

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue

Philippe Dupuy, Marc Legros, Colette Levade, 2010, Microelectron. Reliab..

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies

Philippe Dupuy, Marc Legros, Colette Levade, 2009, Microelectron. Reliab..

Alterations induced in the structure of intelligent power devices by extreme electro-thermal fatigue

Philippe Dupuy, Marc Legros, Colette Levade, 2007 .