G. Vanderschaeve

Characterization and modelling of ageing failures on power MOSFET devices

Marc Legros, Patrick Tounsi, Benjamin Khong, 2007, Microelectron. Reliab..

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue

Philippe Dupuy, Marc Legros, Patrick Tounsi, 2005, Microelectron. Reliab..

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies

Philippe Dupuy, Marc Legros, Colette Levade, 2009, Microelectron. Reliab..

Alterations induced in the structure of intelligent power devices by extreme electro-thermal fatigue

Philippe Dupuy, Marc Legros, Colette Levade, 2007 .