I. N. Osiyuk

发表

Charge trapping characterization of MOCVD HfO2/p-Si interfaces at cryogenic temperatures

Steve Hall, Octavian Buiu, Y. Lu, 2007, Microelectron. Reliab..

Charge trapping and degradation in Ge+ ion implanted SiO2 layers during high-field electron injection

L. Rebohle, I. N. Osiyuk, V. S. Lysenko, 2002, Microelectron. Reliab..

Effect of oxide–semiconductor interface traps on low-temperature operation of MOSFETs

I. N. Osiyuk, V. Lysenko, I. Tyagulski, 2000 .

Light emission and charge trapping in Er-doped silicon dioxide films containing silicon nanocrystals

Wolfgang Skorupa, I. N. Osiyuk, V. S. Lysenko, 2005 .

Correlation between defect-related electroluminescence and charge trapping in Gd-implanted SiO2 layers

I. N. Osiyuk, A. Nazarov, S. Prucnal, 2007 .

Correlation of charge trapping and electroluminescence in highly efficient Si-based light emitters

I. N. Osiyuk, A. Nazarov, L. Rebohle, 2003 .

Rare Earth Ion Implantation for Silicon Based Light Emission

I. N. Osiyuk, M. Helm, A. Nazarov, 2005 .

Charge trapping phenomena in high-efficiency metal-oxide-silicon light-emitting diodes with ion-implanted oxide

I. N. Osiyuk, V. Lysenko, A. Nazarov, 2006 .

Comparative Study of Charge Trapping in High-Dose Si and Ge-Implanted Al / SiO2 / Si Structures

I. N. Osiyuk, V. Lysenko, A. Nazarov, 2005 .

Border traps in 6H-SiC metal–oxide–semiconductor capacitors investigated by the thermally-stimulated current technique

I. N. Osiyuk, V. Lysenko, I. Tyagulski, 2001 .

A Study of the Shallow Electron Traps at the 4H-SiC/SiO2 Interface

I. N. Osiyuk, I. Tyagulski, T. Rudenko, 2003 .

Reactivation of damaged rare earth luminescence centers in ion-implanted metal–oxide–silicon light emitting devices

I. N. Osiyuk, A. Nazarov, L. Rebohle, 2008 .

Quenching of electroluminescence and charge trapping in high-efficiency Ge-implanted MOS light-emitting silicon diodes

I. N. Osiyuk, V. Lysenko, A. Nazarov, 2007 .

Charge trapping in light-emitting SiO2 layers implanted with Ge+ ions

I. N. Osiyuk, V. Lysenko, A. Nazarov, 2002 .

Effect of Shallow Oxide Traps on the Low-Temperature Operation of SOI Transistors

I. N. Osiyuk, V. Lysenko, I. Tyagulski, 2000 .

Thermally activated processes in the buried oxide of SIMOX SOI structures and devices

I. N. Osiyuk, I. P. Barchuk, V. Lysenko, 2001 .

Effect of traps in the transition Si/SiO2 layer on input characteristics of SOI transistors

I. N. Osiyuk, V. Lysenko, I. Tyagulski, 2000 .

The effect of radio-frequency plasma treatment on the electroluminescent properties of violet light-emitting germanium implanted metal-oxide–semiconductor structures

I. N. Osiyuk, A. S. Tkachenko, V. Lysenko, 2005 .

Ion Beam Processing for Silicon - Based Light Emission

I. N. Osiyuk, M. Helm, B. Schmidt, 2003 .