C. Liewald

发表

Photocurrent microscopy of contact resistance and charge carrier traps in organic field-effect transistors

B. Nickel, C. Liewald, D. Reiser, 2016 .

A resistor network simulation model for laser-scanning photo-current microscopy to quantify low conductance regions in organic thin films

B. Nickel, A. Gagliardi, M. Darwish, 2018, Organic Electronics.

All-electronic terahertz nanoscopy

F. Keilmann, R. Hillenbrand, J. Hesler, 2018 .

Scanning photocurrent microscopy of electrons and holes in the pigment semiconductor epindolidione

E. Głowacki, C. Liewald, B. Nickel, 2018, Organic Electronics.

Microdiffraction imaging—a suitable tool to characterize organic electronic devices

B. Nickel, Stefan F Fischer, T. Schülli, 2015 .

Sub-micron phase coexistence in small-molecule organic thin films revealed by infrared nano-imaging

Fritz Keilmann, Christian Westermeier, Adrian Cernescu, 2014, Nature Communications.

Phase-resolved terahertz self-detection near-field microscopy.

Gaetano Scamarcio, Massimo Brambilla, Fritz Keilmann, 2018, Optics express.

Transferable Organic Semiconductor Nanosheets for Application in Electronic Devices

F. Keilmann, B. Nickel, A. Turchanin, 2017, Advanced materials.

Tiny Crystals Located and Identified by Infrared Nanoscopy

F. Keilmann, C. Liewald, 2014, Microscopy Today.