Bong Seob Yang

Role of ZrO2 incorporation in the suppression of negative bias illumination- induced instability in Zn-Sn-O thin film transistors

Cheol Seong Hwang, Jae Kyeong Jeong, C. Hwang, 2011 .

Dynamics of negative bias thermal stress-induced threshold voltage shifts in indium zinc oxide transistors: impact of the crystalline structure on the activation energy barrier

Jae Kyeong Jeong, H. Kim, Sungmin Kim, 2014 .

Anomalous behavior of negative bias illumination stress instability in an indium zinc oxide transistor: A cation combinatorial approach

Jae Kyeong Jeong, C. Hwang, H. Kim, 2012 .

Improvement of the photo-bias stability of the Zn–Sn–O field effect transistors by an ozone treatment

Jae Kyeong Jeong, C. Hwang, H. Kim, 2012 .

Effect of sputter power on the photobias stability of zinc-tin-oxide field-effect transistors

Jae Kyeong Jeong, C. Hwang, Jaeyeong Heo, 2014 .

Improvement of electrical and optical properties of molybdenum oxide thin films by ultralow pressure sputtering method

Jong-Ho Lee, Jong-Ho Lee, H. Kim, 2012 .

Formation of a Bilayer of ALD-SiO2 and Sputtered Al2O3/ZrO2 Films on Polyethylene Terephthalate Substrates as a Moisture Barrier

Jaeyeong Heo, H. Kim, Bong Seob Yang, 2013 .

Photobias instability of high performance solution processed amorphous zinc tin oxide transistors.

Jae Kyeong Jeong, Jaeyeong Heo, H. Kim, 2013, ACS applied materials & interfaces.