Jhe-Ciou Jhu

The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors

Ting‐Chang Chang, Min-Chen Chen, Sheng-Yao Huang, 2012 .

Investigation of Hydration Reaction-Induced Protons Transport in Etching-Stop a-InGaZnO Thin-Film Transistors

Kuan‐Chang Chang, Ting‐Chang Chang, C. Chou, 2015, IEEE Electron Device Letters.

Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatment

Ting‐Chang Chang, G. Chang, Jhe-Ciou Jhu, 2013 .

Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors

Kuan‐Chang Chang, T. Tsai, Yong-En Syu, 2012, IEEE Electron Device Letters.

N2O plasma treatment suppressed temperature-dependent sub-threshold leakage current of amorphous indium-gallium-zinc-oxide thin film transistors

Kuan‐Chang Chang, T. Tsai, Yong-En Syu, 2013 .

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Ya-Chi Hung, Kuan-Chang Chang, Tsung-Ming Tsai, 2014, IEEE Transactions on Electron Devices.

Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress

Kuan‐Chang Chang, T. Tsai, Yong-En Syu, 2012 .