F. Mami

Effect of Fluorine in a Gate Insulator on the Reliability of Indium-Gallium-Zinc Oxide Thin-Film Transistors

Y. Uraoka, Y. Ishikawa, J. Bermundo, 2016 .

Nonparabolicity effects on carrier lifetimes in bulk Hg1-xCdxTe alloys and Mid-Infrared 2D Hg1-xCdxTe/CdTe Single Quantum Well Lasers

F. Mami, A. Kadri, K. Zitouni, 2020 .