Beom-Su Kim

Soft Recovery Process of Mechanically Degraded Flexible a-IGZO TFTs With Various Rolling Stresses and Defect Simulation Using TCAD Simulation

Jin-seong Park, Hyun-Jun Jeong, Ki-Lim Han, 2020, IEEE Transactions on Electron Devices.

Recent review on improving mechanical durability for flexible oxide thin film transistors

Jin-seong Park, Hyun-Jun Jeong, Ki-Lim Han, 2019, Journal of Physics D: Applied Physics.

Electrical Stability Analysis of Dynamic Logic Using Amorphous Indium–Gallium–Zinc-Oxide TFTs

Jin-seong Park, Ki-Lim Han, B. Choi, 2019, IEEE Electron Device Letters.

Comparison of electrical performances of water and organic solvent-based amorphous indium-gallium-zinc-oxide thin-film transistors

Jaewook Jeong, Beom-Su Kim, 2019, Japanese Journal of Applied Physics.

Addition Effects of Sheet-like Ni Nanopowder on the Electrochemical Properties of Positive Electrode in Ni-Zn Redox Flow Battery

B. Ju, Sei-Ki Kim, Beom-Su Kim, 2014 .

Quantitative analysis of interface trap recovery caused by repetitive bending stress in flexible oxide thin-film transistors

Jin-seong Park, Saeroonter Oh, Hyun-Jun Jeong, 2019, Japanese Journal of Applied Physics.

Organic/inorganic hybrid buffer in InGaZnO transistors under repetitive bending stress for high electrical and mechanical stability.

Jin-seong Park, Saeroonter Oh, Ju-Hwan Han, 2019, ACS applied materials & interfaces.