Lee Whetsel
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Lee Whetsel,
2006,
2006 IEEE International Test Conference.
Lee Whetsel,
1994,
Proceedings., International Test Conference.
Yervant Zorian,
Rohit Kapur,
Karim Arabi,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Lee Whetsel,
1993,
Proceedings of IEEE International Test Conference - (ITC).
Lee Whetsel,
1997,
Proceedings International Test Conference 1997.
Lee Whetsel,
L. Whetsel,
1997,
Proceedings International Test Conference 1997.
Lee Whetsel,
1993,
Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.
Lee Whetsel,
1994,
Proceedings., International Test Conference.
Yervant Zorian,
Rohit Kapur,
Erik Jan Marinissen,
1999,
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Lee Whetsel,
1990,
Proceedings. International Test Conference 1990.
Lee Whetsel,
L. Whetsel,
2000,
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
Lee Whetsel,
1992,
Proceedings International Test Conference 1992.
Lee Whetsel,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Lee Whetsel,
1995,
Proceedings of 1995 IEEE International Test Conference (ITC).
Lee Whetsel,
1997,
IEEE Des. Test Comput..
Lee Whetsel,
2002,
Proceedings. International Test Conference.
Lee Whetsel,
Kenneth L. Williams,
Rakesh N. Joshi,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Lee Whetsel,
1996,
Proceedings International Test Conference 1996. Test and Design Validity.
Lee Whetsel,
1990
.
Lee Whetsel,
L. Whetsel,
1991,
1991, Proceedings. International Test Conference.