Jin Qin
发表
Yingjian Liu,
Liang Wang,
Jin Qin,
2019,
SPIE/COS Photonics Asia.
Jun Dai,
Jin Qin,
Baoguang Yan,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
Guijie Liu,
Jin Qin,
Yingchun Xie,
2020,
Sensors.
Yuemin Zhu,
Xinyu Cheng,
Lihui Wang,
2020,
IEEE Sensors Journal.
Tao Deng,
Wei Luo,
Jin Qin,
2019,
International Journal of Heat and Mass Transfer.
Xiaojun Li,
Jin Qin,
J.B. Bernstein,
2006,
IEEE Transactions on Device and Materials Reliability.
Dan Hu,
Ying Zhan,
Guian Wang,
2019,
IGARSS 2019 - 2019 IEEE International Geoscience and Remote Sensing Symposium.
Li Zhang,
Yan Wang,
Lei Zhang,
2016,
2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).
Kaiping Xue,
Yutong Chen,
Jin Qin,
2019,
2019 2nd International Conference on Hot Information-Centric Networking (HotICN).
Xiaojun Li,
Jin Qin,
J.B. Bernstein,
2008,
IEEE Transactions on Device and Materials Reliability.
Dan Hu,
Ying Zhan,
Yuntao Wang,
2019,
IGARSS 2019 - 2019 IEEE International Geoscience and Remote Sensing Symposium.
Li Zhang,
Yan Wang,
Lei Zhang,
2014,
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Hao Yue,
Kaiping Xue,
Qiudong Xia,
2019,
2019 IEEE Global Communications Conference (GLOBECOM).
Ruochen Lu,
Jin Qin,
Wu Xiaoming,
2014
.
Hao Yue,
Kaiping Xue,
Yutong Chen,
2019,
2019 2nd International Conference on Hot Information-Centric Networking (HotICN).
Xiaojun Li,
Jin Qin,
J.B. Bernstein,
2006,
IEEE Transactions on Device and Materials Reliability.
Hancheng Lu,
Jin Qin,
Jiangping Han,
2019,
2019 IEEE Global Communications Conference (GLOBECOM).
Li Su,
Jin Qin,
Jingjing Yang,
2017
.
Yan Wang,
Lei Zhang,
Dong Huang,
2017,
2017 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT).
Jun Dai,
Jin Qin,
Baoguang Yan,
2009,
IEEE Transactions on Device and Materials Reliability.
Jin Qin,
J. Bernstein,
J.B. Bernstein,
2006,
2006 IEEE International Integrated Reliability Workshop Final Report.
Jin Qin,
J. Bernstein,
J.B. Bernstein,
2007,
2007 IEEE International Integrated Reliability Workshop Final Report.