Jeng-Shyan Lin

Air-gap guard ring for pixel sensitivity and crosstalk improvement in deep sub-micron CMOS image sensor

Dun-Nian Yaung, Chien-Hsien Tseng, C.S. Wang, 2003, IEEE International Electron Devices Meeting 2003.

Color mixing improvement of CMOS image sensor with air-gap-guard ring in deep-submicrometer CMOS technology

C.S. Lin, C.S. Wang, C.Y. Lin, 2005, IEEE Electron Device Letters.

5nm CMOS Production Technology Platform featuring full-fledged EUV, and High Mobility Channel FinFETs with densest 0.021µm2 SRAM cells for Mobile SoC and High Performance Computing Applications

Jun He, R. Chen, Geoffrey Yeap, 2019, 2019 IEEE International Electron Devices Meeting (IEDM).