W. Moeller
发表
M. Helm,
H. Schmidt,
Shengqiang Zhou,
2009,
0908.0127.
W. Jacob,
P. Reinke,
W. Moeller,
1991
.
D. Mckenzie,
M. Bilek,
W. Moeller,
2004
.
K. Heinig,
W. Moeller,
T. Mueller,
2002,
cond-mat/0208137.
Ming Lu,
S. Facsko,
W. Moeller,
2010,
1002.1002.
W. Moeller,
B. Scherzer,
O. Petitpierre,
1990
.
W. Moeller,
W. Moller,
D. Boutard,
1990
.
M. Helm,
D. Borchert,
L. Rebohle,
2001
.
W. Moeller,
B. Scherzer,
P. Boergesen,
1985
.
W. Moeller,
1983
.
J. Roth,
R. Behrisch,
W. Moeller,
1990
.
E. Richter,
F. Prokert,
W. Moeller,
2004
.
Xi Wang,
F. Prokert,
A. Kolitsch,
2000
.
D. Mckenzie,
M. Bilek,
K. Fisher,
2012
.
E. Richter,
W. Moeller,
S. Parascandola,
1999
.
M. Maitz,
M. Pham,
E. Richter,
2005
.
W. Moeller,
L. Horton,
1991
.
J. Roth,
D. Post,
R. Behrisch,
1986
.
Jin Huang,
Ehrenfried Zschech,
M. Loeffler,
2016,
Microelectron. Reliab..
Nanocrystal Formation in Si Implanted Thin SiO2 Layers under the Influence of an Absorbing Interface
K. Heinig,
W. Moeller,
T. Muller,
2002,
cond-mat/0212285.
M. Helm,
H. Schmidt,
Shengqiang Zhou,
2009,
0908.0127.
E. Richter,
H. Reuther,
F. Prokert,
2002
.
W. Moeller,
B. Scherzer,
1988
.
W. Moeller,
B. Scherzer,
D. Boutard,
1990
.
W. Moeller,
I. Gudowska,
B. Scherzer,
1990
.
E. Taglauer,
B. Baretzky,
W. Moeller,
1989
.
E. Zschech,
W. V. van Dorp,
J J L Mulders,
2018,
Ultramicroscopy.
R. Gago,
I. Jiménez,
G. Abrasonis,
2007,
0706.2258.