V. Gherman
发表
V. Gherman,
S. Evain,
2009
.
B. Becker,
H. Wunderlich,
I. Polian,
2004
.
V. Gherman,
Patrick Girard,
Arnaud Virazel,
2020,
J. Electron. Test..
Valentin Gherman,
Fabrice Auzanneau,
Yannick Bonhomme,
2011,
29th VLSI Test Symposium.
G. Molas,
S. Dumas,
B. Giraud,
2023,
2023 IEEE International Memory Workshop (IMW).
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2017,
2017 22nd IEEE European Test Symposium (ETS).
Valentin Gherman,
Mickael Cartron,
Yannick Bonhomme,
2009,
2009 Design, Automation & Test in Europe Conference & Exhibition.
V. Gherman,
S. Evain,
Y. Bonhomme,
2013,
Journal of electronic testing.
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2012,
2012 17th IEEE European Test Symposium (ETS).
Valentin Savin,
Valentin Gherman,
Samuel Evain,
2014,
2013 18th IEEE European Test Symposium (ETS).
Valentin Gherman,
Samuel Evain,
V. Gherman,
2013,
Journal of Electronic Testing.
Valentin Gherman,
Yannick Bonhomme,
Samuel Evain,
2011,
2011 IEEE 17th International On-Line Testing Symposium.
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2006,
Eleventh IEEE European Test Symposium (ETS'06).
V. Gherman,
Valentin Gherman,
2006
.
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2005,
23rd IEEE VLSI Test Symposium (VTS'05).
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2019,
Microelectronics Reliability.
Luigi Dilillo,
Emna Farjallah,
Jean-Marc Armani,
2017,
2017 IEEE International Test Conference (ITC).
Jürgen Schlöffel,
Valentin Gherman,
Hans-Joachim Wunderlich,
2007,
GLSVLSI '07.