J. Roux

发表

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

P. Perdu, R. Desplats, J. Roux, 2004, Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).

J. Graffeuil, R. Plana, L. Escotte, 1995, IEEE Electron Device Letters.

L. Escotte, Robert Plana, Jacques Graffeuil, 1995 .