H. Jeong

Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

Dong Myong Kim, Jaehyeong Kim, Dae Hwan Kim, 2011, IEEE Electron Device Letters.

Density of states-based design of metal oxide thin-film transistors for high mobility and superior photostability.

Eunha Lee, Joonsuk Park, Sang Yoon Lee, 2012, ACS applied materials & interfaces.

Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability

D. M. Kim, D. Kim, Sungchul Kim, 2012, IEEE Transactions on Electron Devices.

Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Dong Myong Kim, Jaehyeong Kim, Dae Hwan Kim, 2012, IEEE Electron Device Letters.

Modified Conductance Method for Extraction of Subgap Density of States in a-IGZO Thin-Film Transistors

Dong Myong Kim, Sungwoo Jun, Dae Hwan Kim, 2012, IEEE Electron Device Letters.

Machine-Learning-Based Compact Modeling for Sub-3-nm-Node Emerging Transistors

J. Kong, Hyungmin Cho, H. Jeong, 2022, Electronics.