L Y Beaulieu

Measuring the cantilever-position-sensitive detector distance and cantilever curvature for cantilever sensor applications.

Meng Xu, Ye Tian, M L Coates, 2009, The Review of scientific instruments.

A complete analysis of the laser beam deflection systems used in cantilever-based systems.

Michel Godin, Peter Grütter, M. Godin, 2007, Ultramicroscopy.

Surface stress, kinetics, and structure of alkanethiol self-assembled monolayers.

Michel Godin, Peter Grütter, M. Godin, 2004, Langmuir : the ACS journal of surfaces and colloids.

Measuring Thickness Changes in Thin Films Due to Chemical Reaction by Monitoring the Surface Roughness with In Situ Atomic Force Microscopy

L Y Beaulieu, A D Rutenberg, J R Dahn, 2002, Microscopy and Microanalysis.