W F Egelhoff

Review of Noise Sources in Magnetic Tunnel Junction Sensors

P. Lai, Z. Lei, W. Egelhoff, 2011, IEEE Transactions on Magnetics.

Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography.

D. Larson, T. Prosa, W. Egelhoff, 2011, Ultramicroscopy.