S. Chen

Scanning probe lithography with real time position control interferometer

B. C. Yao, Forest Shih-Sen Chien, S. Chen, 2002, Proceedings of the 2nd IEEE Conference on Nanotechnology.

Sub-micron X-ray Computed Tomography for Non-Destructive 3D Visualization and Analysis

Jeff Gelb, Michael Feser, Wenbing Yun, 2009, Microscopy and Microanalysis.