R. Chaplain

Realization and characterization of Er and Yb glasses obtained by the sol-gel method

M. Gauneau, M. Gauneau, R. Chaplain, 1991 .

Oxygen complexes in III‐V compounds as determined by secondary‐ion mass spectrometry under cesium bombardment

M. Salvi, M. Gauneau, D. Lecrosnier, 1989 .

Secondary ion mass spectrometry generates swelling of GaSb: Depth resolution and secondary ion yields

Yves Toudic, M. Gauneau, A. Rupert, 1993 .