Yue Wang

Research of single event burnout in a high-performance radiation-hardened SOI lateral power MOSFET

Runze Chen, Yue Wang, Lixin Wang, 2022, Microelectronics Reliability.

A Single-Event Burnout Hardened Super-Junction Trench SOI LDMOS with Additional Hole Leakage Paths

Yue Wang, Lixin Wang, Yuanzhe Li, 2022, Electronics.

A Novel Radiation-Hardened CCDM-TSPC Compared with Seven Well-Known RHBD Flip-Flops in 180 nm CMOS Process

Yue Wang, Lixin Wang, Min Guo, 2022, Electronics.