Min Guo

Research of single event burnout in a high-performance radiation-hardened SOI lateral power MOSFET

Runze Chen, Yue Wang, Lixin Wang, 2022, Microelectronics Reliability.

A Novel Radiation-Hardened CCDM-TSPC Compared with Seven Well-Known RHBD Flip-Flops in 180 nm CMOS Process

Yue Wang, Lixin Wang, Min Guo, 2022, Electronics.

A Novel DNU Self-Recoverable and SET Pulse Filterable Latch Design for Aerospace Applications

Lixin Wang, Min Guo, Yuanzhe Li, 2023, Electronics.

An Optimized Structure of Split-Gate Resurf Stepped Oxide UMOSFET

Runze Chen, Lixin Wang, Min Guo, 2020, Electronics.