D. Boychenko

Power MOSFET single event burnout hardness increasing by neutron preirradiation

L. Kessarinskiy, D. Boychenko, A. Nikiforov, 2017, 2017 IEEE 30th International Conference on Microelectronics (MIEL).

Simulation of impact of the HCP on the CNT-nanosensor by the molecular dynamics method

A. V. Demidova, D. Boychenko, A. Sogoyan, 2017, Russian Microelectronics.

Safe Operation Area Of Trench-Gate And Low-Charge Power MOSFET

D. Boychenko, A. Polokhov, T. Kritskaya, 2018, 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

An analysis of the radiation behavior of pulse voltage stabilizers

L. Kessarinskiy, D. Boychenko, A. Nikiforov, 2012, Russian Microelectronics.

SEFI cross-section evaluation by fault injection software approach and hardware detection

D.V. Boychenko, I.O. Loskutov, P. V. Nekrasov, 2017, 2017 IEEE 30th International Conference on Microelectronics (MIEL).