C. Wheatley

Experimental studies of single-event gate rupture and burnout in vertical power MOSFETs

C. F. Wheatley, J. L. Titus, J. Titus, 1996 .

Impact of oxide thickness on SEGR failure in vertical power MOSFETs; development of a semi-empirical expression

R. L. Pease, Kenneth F. Galloway, J. R. Brews, 1995 .

Single-event gate rupture in vertical power MOSFETs; an original empirical expression

C. F. Wheatley, J. L. Titus, D. I. Burton, 1994 .

A conceptual model of a single-event gate-rupture in power MOSFETs

Kenneth F. Galloway, J. R. Brews, Ronald D. Schrimpf, 1993 .

Influence of ion beam energy on SEGR failure thresholds of vertical power MOSFETs

R. L. Pease, Kenneth F. Galloway, J. R. Brews, 1996 .

A study of ion energy and its effects upon an SEGR-hardened stripe-cell MOSFET technology [space-bas

C. Frank Wheatley, J. L. Titus, D. I. Burton, 2001 .

INTEGRATED SOLID-STATE DEVICES

C. Wheatley, 1974 .

Responses of radiation-hardened power MOSFETs to neutrons

D. I. Burton, J. E. Gillberg, J. Titus, 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

(Single-Event Gate-Rupture in Power MOSFETs: Prediction of Breakdown Biases and Evaluation of Oxide

J. R. Brews, C. F. Wheatley, J. L. Titus, 1995 .

SEGR and SEB in n-channel power MOSFETs

Kenneth F. Galloway, J. R. Brews, Ronald D. Schrimpf, 1996 .

Effect of ion energy upon dielectric breakdown of the capacitor response in vertical power MOSFETs

C. F. Wheatley, A. B. Campbell, J. L. Titus, 1998 .

A physical interpretation for the single-event-gate-rupture cross-section of n-channel power MOSFETs

Kenneth F. Galloway, Ronald D. Schrimpf, C. F. Wheatley, 1996 .

Development of cosmic ray hardened power MOSFET's

C. F. Wheatley, J. L. Titus, J. Titus, 1989 .

The effects of ionizing radiation on power-MOSFET termination structures

D. I. Burton, peixiong zhao, K. Galloway, 1989 .

A new PSPICE sub-circuit for the power MOSFET featuring global temperature options

W. J. Hepp, C. F. Wheatley, C. Wheatley, 1991, PESC '91 Record 22nd Annual IEEE Power Electronics Specialists Conference.