Hee-Goo Kim

Improvement of resistive memory switching in NiO using IrO2

U-In Chung, In-Gyu Baek, Hae-Sung Kim, 2006 .

Reliable Multivalued Conductance States in TaO x Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis.

Hyunsang Hwang, Chun-Yeol You, Sung Min Kwon, 2018, ACS applied materials & interfaces.