R. N. Ghoshtagore

Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes

Richard A. Allen, Ronald G. Dixson, Michael W. Cresswell, 1996 .

Mechanism of CVD Thin Film SnO2 Formation

R. Ghoshtagore, R. N. Ghoshtagore, 1978 .

Electrical linewidth test structures fabricated in monocrystalline films for reference-material applications

Jeffry J. Sniegowski, M. W. Cresswell, R. A. Allen, 1998 .

High-resolution transmission electron microscopy calibration of critical dimension (CD) reference materials

M. W. Cresswell, R. A. Allen, Loren W. Linholm, 2001 .