Richard M Silver

Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis.

Ravikiran Attota, Thomas A Germer, Richard M Silver, 2008, Optics letters.

Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopy.

Hui Zhou, Francois Goasmat, Bryan M Barnes, 2013, Optics express.

Optimizing the nanoscale quantitative optical imaging of subfield scattering targets.

Mark-Alexander Henn, Hui Zhou, Bryan M Barnes, 2016, Optics letters.

Deep subwavelength nanometric image reconstruction using Fourier domain optical normalization

Mark-Alexander Henn, Hui Zhou, Bryan M Barnes, 2016, Light: Science & Applications.