Chih-Tang Sah

发表

New techniques of capacitance-voltage measurements of semiconductor junctions

Ming-Fu Li, Chih-Tang Sah, Ming-Fu Li, 1982 .

A distributed gate bistable MOS transistor

Chih-Tang Sah, H. S. Fu, 1971 .

A Computer-Automated Temperature Control System for Semiconductor Measurements.

Chih-Tang Sah, Roger Nohl Switzer, Philip C H Chan, 1979 .

New integral representations of circuit models and elements for the circuit technique for semiconductor device analysis

Chih-Tang Sah, C. Sah, 1987 .

Design, Error Analysis and Operation of a Noise Autocorrelator.

Chih-Tang Sah, Michael J McNutt, 1978 .

Effects of spatially inhomogeneous oxide charge distribution on the MOS capacitance‐voltage characteristics

Chih-Tang Sah, M. J. McNutt, C. Sah, 1974 .

Models and experiments on degradation of oxidized silicon

Chih-Tang Sah, C. Sah, 1987 .

Theory of low-frequency generation noise in junction-gate field-effect transistors

Chih-Tang Sah, C. Sah, 1964 .

The spatial variation of the quasi-Fermi potentials in p-n junctions

Chih-Tang Sah, C. Sah, 1966 .

Degradation of bipolar transistor current gain by hot holes during reverse emitter-base bias stress

Chih-Tang Sah, Arnost Neugroschel, Michael S. Carroll, 1996 .

The effects of fixed bulk charge on the thermal noise in metal-oxide-semiconductor transistors

Chih-Tang Sah, F. H. Hielscher, C. Sah, 1966 .

A new method for the determination of dopant and trap concentration profiles in semiconductors

Chih-Tang Sah, Ming-Fu Li, Ming-Fu Li, 1982 .

Observation of threshold oxide electric field for trap generation in oxide films on silicon

Toshikazu Nishida, Chih-Tang Sah, Charles Ching‐Hsiang Hsu, 1988 .

Threshold voltage models of the narrow-gate effect in micron and submicron MOSFETs

Chih-Tang Sah, Steve Shao-Shiun Chung, 1988 .

Trap controlled minority-carrier mobility in heavily doped silicon

F. A. Lindholm, Chih-Tang Sah, Arnost Neugroschel, 1985 .

Exact large-signal lumped-network representation of a semiconductor

Chih-Tang Sah, 1972 .

Base current relaxation transient in reverse emitter-base bias stressed silicon bipolar junction transistors

Chih-Tang Sah, Arnost Neugroschel, Michael S. Carroll, 1997 .

Random telegraphic signals in silicon bipolar junction transistors

Chih-Tang Sah, Arnost Neugroschel, Michael S. Carroll, 1995 .

Hot carriers in silicon surface inversion layers

Karl Hess, Chih-Tang Sah, K. Hess, 1974 .

A quasi-three-dimensional large-signal circuit model for lateral transient analysis of MOS device

Chih-Tang Sah, C. Sah, Allen P.I. Ho, 1980 .

New mobility-measurement technique on inverted semiconductor surfaces near the conduction threshold

Chih-Tang Sah, C. C. Shiue, 1979 .

Theory and experiments of low-frequency generation-recombination noise in MOS transistors

Chih-Tang Sah, L. D. Yau, C. Sah, 1969 .

Deactivation of group III acceptors in silicon during keV electron irradiation

Chih-Tang Sah, C. Sah, J. Tzou, 1983 .

The equivalent circuit model in solid-state electronics—III: Conduction and displacement currents

Chih-Tang Sah, C. Sah, 1970 .

Study of the atomic models of three donorlike defects in silicon metal‐oxide‐semiconductor structures from their gate material and process dependencies

Chih-Tang Sah, C. Sah, J. Tzou, 1984 .

Experimental observations of the effects of oxide charge inhomogeneity on fast surface state density from high−frequency MOS capacitance−voltage characteristics

Chih-Tang Sah, M. J. McNutt, C. Sah, 1975 .

Generation-Recombination-Trapping at Interface Traps In Compact MOS Transistor Modeling

Chih-Tang Sah, C. Sah, B. Jie, 2006, 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.

On the ‘excess white noise’ in MOS transistors☆

Chih-Tang Sah, L. D. Yau, C. Sah, 1969 .

Computer-aided study of steady-state carrier lifetimes under arbitrary injection conditions

Chih-Tang Sah, Philip C.H. Chan, 1979 .

High frequency space charge layer capacitance of strongly inverted semiconductor surfaces

Chih-Tang Sah, M. J. McNutt, C. Sah, 1974 .

Transport in semiconductors with low scattering rate and at high frequencies

Fredrik A. Lindholm, Chih-Tang Sah, C. Sah, 1973 .

Degradation of silicon bipolar junction transistors at high forward current densities

Chih-Tang Sah, Arnost Neugroschel, Michael S. Carroll, 1997 .

The equivalent circuit model in solid-state electronics—Part I: The single energy level defect centers

Chih-Tang Sah, C. Sah, 1967 .

Microscopic Theory of Energy Distribution of SiO2/Si Interface Traps: A Survey of History and Some New Results

Chih-Tang Sah, Bin Bin Jie, Zuhui Chen, 2006, 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.

Series equivalent circuit representation of SiO2Si interface and oxide trap states

Chih-Tang Sah, C. Sah, D. H. Eaton, 1973 .

The equivalent circuit model in solid-state electronics—Part II: The multiple energy level impurity centers

Chih-Tang Sah, C. Sah, 1967 .

Matrix analysis of distributed semiconductor circuit models

Chih-Tang Sah, F. Hennig, 1973 .

Reduction of interface traps in p-channel MOS transistors during channel-hot-hole stress

Chih-Tang Sah, K. M. Han, 1998 .

Analysis of the narrow gate effect in submicrometer MOSFET's

Chih-Tang Sah, C. Sah, Chao-Ren Ji, 1983 .

Differential d.c. conductance of a p-n-junction space-charge region

Chih-Tang Sah, 1972 .

Thermal emission and capture of electrons at sulfur centers in silicon

Chih-Tang Sah, L. L. Rosier, C. Sah, 1970 .

Correlation of experiments with a two-section-model theory of the saturation drain conductance of MOS transistors

Chih-Tang Sah, C. Sah, T. L. Chiu, 1968 .

Current-acceleration for rapid time-to-failure determination of bipolar junction transistors under emitter-base reverse-bias stress

Chih-Tang Sah, Arnost Neugroschel, Michael S. Carroll, 1995 .

DCIV diagnosis for submicron MOS transistor design, process, reliability and manufacturing

Chih-Tang Sah, 2001, 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443).

Thickness dependences of solar cell performance

Chih-Tang Sah, 1982 .

Gate tunneling currents in ultrathin oxide metal–oxide–silicon transistors

Jin Cai, Chih-Tang Sah, J. Cai, 2001 .

Generation‐annealing kinetics of the interface donor states at 0.25 eV above the midgap and the turn‐around phenomena on oxidized silicon during avalanche electron injection

Chih-Tang Sah, C. Sah, J. Tzou, 1983 .

Theory of Scattering of Electrons in a Nondegenerate-Semiconductor-Surface Inversion Layer by Surface-Oxide Charges

Chih-Tang Sah, T. H. Ning, T. Ning, 1972 .

Exact capacitance of a lossless MOS capacitor

Chih-Tang Sah, M. J. McNutt, C. Sah, 1976 .

Effect of hydrogen chloride during oxidation of silicon on trap generation by avalanche electron injection

Chih-Tang Sah, Charles Ching‐Hsiang Hsu, Ann Joyce Chen, 1986 .

Separation of interface and nonuniform oxide traps by the DC current-voltage method

Chih-Tang Sah, J. Kavalieros, C. Sah, 1996 .

Theoretical accuracy of using Boltzmann and ionized impurity approximations in the analyses of recombination current at interface traps in metal-oxide-silicon structures

Chih-Tang Sah, Zuhui Chen, Bin B. Jie, 2006 .

Performance improvements from penetrating back‐surface field in a very high efficiency terrestrial thin‐film crystalline silicon solar cell

Fredrik A. Lindholm, Chih-Tang Sah, 1984 .

Two-dimensional numerical analysis of the narrow gate effect in MOSFET

Chih-Tang Sah, C. Sah, Chao-Ren Ji, 1983 .

Hydrogenation of boron acceptor in silicon during electron injection by Fowler−Nordheim tunneling

Chih-Tang Sah, Samuel Cheng‐Sheng Pan, Calvin Yi‐Ping Chao, 1987 .

Small-signal equivalent π networks for carrier generation--recombination--trapping at imperfection centres in semiconductors

Chih-Tang Sah, C. Sah, 1971 .

Reply to ’’Comments on ’Normal modes of semiconductor p‐n‐junction devices for material‐parameter determination’ ’’

Fredrik A. Lindholm, Chih-Tang Sah, C. Sah, 1981 .

Two pathways of positive oxide‐charge buildup during electron tunneling into silicon dioxide film

Chih-Tang Sah, C. Sah, Yi Lu, 1994 .

Current saturation and drain conductance of junction-gate field-effect transistors

Chih-Tang Sah, C. Sah, S. Y. Wu, 1967 .

Field dependence of two large hole capture cross sections in thermal oxide on silicon

Chih-Tang Sah, Jack Yuan‐Chen Sun, Joseph Jeng‐Tao Tzou, 1983 .

Electron-Hole Recombination Statistics in Semiconductors through Flaws with Many Charge Conditions

Chih-Tang Sah, W. Shockley, C. Sah, 1958 .

An MOS-oriented investigation of effective mobility theory

Chih-Tang Sah, C. Sah, R. Pierret, 1968 .

Differential equation solutions of MOS transmission line models generalized to lossy cases

Chih-Tang Sah, M. J. McNutt, C. Sah, 1978 .

Application of the distributed equilibrium equivalent circuit model to semiconductor junctions

L. Forbes, Chih-Tang Sah, C. Sah, 1969 .

Lateral profiling of impurity surface concentration in submicron metal–oxide–silicon transistors

Chih-Tang Sah, Y. H. Wang, 2001 .

Effect of surface recombination and channel on P-N junction and transistor characteristics

Chih-Tang Sah, C. Sah, 1962, IRE Transactions on Electron Devices.

Application of the transmission line equivalent circuit model to the analysis of the PN junction admittance under d.c. bias

Chih-Tang Sah, L. D. Yau, C. Sah, 1973 .

Theory and experiments on the 1/f surface noise of MOS insulated-gate field-effect transistors

Chih-Tang Sah, C. Sah, 1964 .