N. Nakagiri

发表

Focusing and Imaging Properties of a Nickel Phase Zone Plate

H. Kihara, N. Watanabe, H. Fujisaki, 1992 .

Focusing Efficiency and Resolution of a Nickel Phase Zone Plate for Soft X-rays

H. Kihara, N. Watanabe, H. Fujisaki, 1991 .

Measurement of Soft X-Ray Absorption by Al, Cr, and Ni Using Synchrotron Radiation

H. Nagata, H. Fujisaki, T. Miyahara, 1990 .

Design of a gradient refractive index phase zone plate for soft x-rays.

H. Fujisaki, N. Nakagiri, 1990, Applied optics.

Scanning probe anodization: Nanolithography using thin films of anodically oxidizable materials as resists

H. Sugimura, N. Nakagiri, 1996 .

Site-selective diamond growth using a platinum film and a silicon oxide mask

H. Sugimura, O. Takai, N. Nakagiri, 1998 .

Fabrication of a micro-patterned diamond film by site-selective plasma chemical vapor deposition

H. Sugimura, O. Takai, N. Nakagiri, 1998 .

Alkylsilane self-assembled monolayer photolithography: Effects of proximity gap on photodegradation and patterning resolution

H. Sugimura, O. Takai, N. Nakagiri, 2003 .

Multilayer resist films applicable to nanopatterning of insulating substrates based on current-injecting scanning probe lithography

H. Sugimura, O. Takai, N. Nakagiri, 1999 .

AFM LITHOGRAPHY IN CONSTANT CURRENT MODE

H. Sugimura, N. Nakagiri, 1997 .

Scanning probe lithography using a trimethylsilyl organosilane monolayer resist

H. Sugimura, N. Nakagiri, Keiko Okiguchi, 1996 .

NANOSCOPIC SURFACE ARCHITECTURE BASED ON SCANNING PROBE ELECTROCHEMISTRY AND MOLECULAR SELF-ASSEMBLY

H. Sugimura, N. Nakagiri, 1997 .

Kelvin Probe Force Microscopy Images of Microstructured Organosilane Self-Assembled Monolayers

H. Sugimura, O. Takai, N. Saito, 2001 .

Analysis of Atomic Force Curve Data for Mapping of Surface Properties in Water

H. Sugimura, O. Takai, L. Sirghi, 2001 .

Fabrication of silicon nanostructures through scanning probe anodization followed by chemical etching

H. Sugimura, N. Nakagiri, 1995 .

Organic monolayer spontaneously formed on spatially arranged nanostructures of silicon oxide and gold

H. Sugimura, N. Nakagiri, 1996 .

Surface potential microscopy for organized molecular systems

H. Sugimura, O. Takai, N. Saito, 2002 .

Electrochemical nanolithography using scanning probe microscopy: fabrication of patterned metal structures on silicon substrates

H. Sugimura, N. Nakagiri, 1996 .

Maskless patterning of silicon surface based on scanning tunneling microscope tip‐induced anodization and chemical etching

H. Sugimura, M. Miyashita, T. Onuki, 1994 .

Development of a metal patterned cantilever for scanning capacitance microscopy and its application to the observation of semiconductor devices

Yoshihiko Suzuki, H. Sugimura, M. Miyashita, 1997 .

Effects of an adsorbed water layer and self-assembled organosilane monolayers on scanning probe microscopy of silicon pn structures

K. Hayashi, H. Sugimura, O. Takai, 2003 .

Potential shielding by the surface water layer in Kelvin probe force microscopy

Hiroyuki Sugimura, Kazuyuki Hayashi, Osamu Takai, 2002 .

Application of scanning capacitance microscopy to semiconductor devices

Yoshihiko Suzuki, H. Sugimura, M. Miyashita, 1997 .

Organosilane Monolayer Resists for Scanning Probe Lithography

H. Sugimura, N. Nakagiri, 1997 .

A Pressure Cell for the Measurement of the Curie Temperature with the Cubic-Anvil Press

H. Fujiwara, N. Nakagiri, H. Tange, 1979 .

Pressure Effects on the Curie Temperature of (Co1-xMnx)2P

H. Fujiwara, H. Fujii, T. Okamoto, 1983 .

Surface potential images of self‐assembled monolayers patterned by organosilanes: ab initio molecular orbital calculations

H. Sugimura, O. Takai, N. Nakagiri, 2002 .

Fabrication of microdiamond array and electrical characterization of individual diamond microcrystals based on scanning probe microscopy

H. Sugimura, O. Takai, Yoshiki Sato, 1999 .

Surface potential contrasts between silicon surfaces covered and uncovered with an organosilane self-assembled monolayer.

H. Sugimura, O. Takai, N. Saito, 2002, Ultramicroscopy.

Surface potentials of patterned organosilane self-assembled monolayers acquired by Kelvin probe force microscopy and ab initio molecular calculation

H. Sugimura, O. Takai, N. Saito, 2001 .

Differential friction force spectroscopy of micropatterned organosilane self-assembled monolayers

H. Sugimura, O. Takai, N. Nakagiri, 2001 .

Surface Potential Images of Microstructured Organosilane Self-Assembled Monolayers Acquired by Kelvin Probe Force Microscopy : Atoms, Molecules, and Chemical Physics

H. Sugimura, O. Takai, N. Saito, 2001 .

Force microscopy imaging of photopatterned organosilane monolayers: application to probe alignment in AFM patterning following photolithography

H. Sugimura, N. Nakagiri, 1998 .

Twin‐probe scanning tunneling microscope

N. Nakagiri, Shigemi Tsukamoto, B. Siu, 1991 .

Site discrimination of adatoms in Si(111)-7 × 7 by noncontact atomic force microscopy

H. Sugimura, N. Nakagiri, Keiko Okiguchi, 1997 .

Theoretical Study of Hysteresis Phenomena of Pressure-Induced Polymorphic Transition in Alkali Halides

N. Nakagiri, M. Nomura, 1982 .

Scanning tunnelling microscopy measurements of carbon deposited on to graphite

H. Kaizuka, N. Nakagiri, 1989 .

Scanning probe nanofabrication of chemically active areas on substrate covered with organosilane monolayers

Hiroyuki Sugimura, H. Sugimura, Nobuyuki Nakagiri, 1997 .

Micropatterning of organosilane self-assembled monolayers using vacuum ultraviolet light at 172 nm: resolution evaluation by Kelvin-probe force microscopy

H. Sugimura, O. Takai, Kazuyuki Hayashi, 2003 .

Crystal structure of magnetite under pressure

Murli H. Manghnani, S. Kimura, Li Chung Ming, 1986 .

Measurement of the Resistance of Manganin under Liquid Pressure to 100 kbar and Its Application to the Measurement of the Transition Pressures of Bi and Sn

H. Fujiwara, N. Nakagiri, Y. Hirata, 1982 .

Effect of Sample Topography on Adhesive Force in Atomic Force Spectroscopy Measurements in Air

O. Takai, K. Sugisaki, L. Sirghi, 2000 .

Crystal Structure of MgF2 and FeF2 Under High Pressure

Y. H. Kim, Li Chung Ming, M. Manghnani, 2013 .

Anisotropic Lattice Compression in Fe 2 P

H. Fujiwara, H. Fujii, T. Okamoto, 1981 .

Measurement of the Resistance of Manganin Wire with Cubic-Anvil Type Pressure Apparatus. II

H. Fujiwara, N. Nakagiri, M. Nomura, 1981 .

Data processing in force curve mapping

K. Sugisaki, N. Nakagiri, 1999 .

Orientation Relation in the Pressure-Induced Transition B1→B2 of RbCl Observed by an X-Ray Four-Circle Diffractometer

H. Fujiwara, N. Nakagiri, M. Nomura, 1983 .

Determination of the Transition Pressures of Some Alkali Halides under Hydrostatic Pressure with X-Ray Diffraction Method

Y. Yamamoto, H. Fujiwara, N. Nakagiri, 1979 .

Investigation of the α‐Fe⇌ε‐Fe Phase Transition by Synchrotron Radiation

M. Manghnani, N. Nakagiri, L. Ming, 2013 .

Degradation of a Trimethylsilyl Monolayer on Silicon Substrates Induced by Scanning Probe Anodization

H. Sugimura, N. Nakagiri, 1995 .