Paul C. Montgomery

发表

Contrast Enhancement Of ESPI Vibration Patterns By Speckle Averaging In A Video Frame Store

Paul C. Montgomery, Brian D. Bergquist, 1986, Other Conferences.

High speed implementation of a three-dimensional shape profiler with submillimeter precision using a digital light processing device and a new efficient algorithm for absolute phase retrieval

Bruno Serio, Patrice Twardowski, Paul C. Montgomery, 2015 .

2D discrete high order energy operators for surface profiling using white light interferometry

Abdel-Ouahab Boudraa, Fabien Salzenstein, Paul C. Montgomery, 2003, Seventh International Symposium on Signal Processing and Its Applications, 2003. Proceedings..

Verification of the form of microlens arrays for atmospheric wavefront sensors using phase-stepping microscopy

Paul C. Montgomery, Jean-Pierre Fillard, Guy Artzner, 1993, Optics & Photonics.

Three-dimensional nanoprofiling of semiconductor surfaces

Paul C. Montgomery, Jean-Pierre Fillard, N. Tchandjou, 1991, Optics & Photonics.

Light scattering on nanoaggregates in bulk indium phosphide materials

Paul C. Montgomery, Jean-Pierre Fillard, Jean-Marc Lussert, 1990, Optics & Photonics.

Laser-scanning tomography and related dark-field nanoscopy method

Paul C. Montgomery, Michel Castagne, Jean-Pierre Fillard, 1991, Optics & Photonics.

Surface defect analysis of semiconductor materials and devices using nanoscopy techniques

Eric Andre, Paul C. Montgomery, Denis Montaner, 1992, Optics & Photonics.

Super-resolution 3D optical imaging of semiconductors using coherence microscopy

Driss Benhaddou, Paul C. Montgomery, Jean-Marc Lussert, 1995, Electronic Imaging.

Dark-field optical microscopy in semiconductor materials: a typical answerable inverse problem

Paul C. Montgomery, Jean-Pierre Fillard, Syamsa M. Ardisasmita, 1990, Optics & Photonics.

Forward looking innovations in electronic speckle pattern interferometry (ESPI)

Paul C. Montgomery, 1987 .

Peak fringe scanning microscopy: submicron 3D measurement of semiconductor components

Paul C. Montgomery, Jean-Pierre Fillard, 1993, Optics & Photonics.

Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

Abdel-Ouahab Boudraa, Fabien Salzenstein, Paul C. Montgomery, 2005, EURASIP J. Adv. Signal Process..

Phase stepping digital interference microscopy (PSM) image improvements by fuzzy logic algorithms

Paul C. Montgomery, Jean-Pierre Fillard, Patrick Faurous, 1995, Electronic Imaging.

Deep field reflection mode for high-resolution surface relief exploration by coherence probe microscopy

Paul C. Montgomery, Jean-Marc Lussert, 1996, Other Conferences.

Sub-diffraction surface topography measurement using a microsphere-assisted Linnik interferometer

Pierre Pfeiffer, Paul C. Montgomery, Audrey Leong-Hoï, 2017, Optical Metrology.

Optical investigation of fluoride glass planar waveguides made by vapour phase deposition

Driss Benhaddou, Brigitte Boulard, Charles Jacoboni, 1995 .

Characterization of III-V materials by optical interferometry

Paul C. Montgomery, D. Montaner, Jean-Pierre Fillard, 1993 .

High resolution and sensitivity infrared tomography

Paul C. Montgomery, Michel Castagne, P. Gall, 1990 .

Interferometric roughness measurement of Ohmic contact/III–V semiconductor interfaces

Driss Benhaddou, Paul C. Montgomery, D. Montaner, 1997 .

Buried interface characterization in optoelectronic materials by interference microscopy

Driss Benhaddou, Paul C. Montgomery, Jacques Bonnafe, 2001 .

High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy

Paul C. Montgomery, Sylvain Lecler, Stéphane Perrin, 2019, physica status solidi (a).