Takumi Maehara

Reflectance degradation of soft X-ray multilayer filters upon exposure to synchrotron radiation

H. Kimura, M. Yanagihara, T. Namioka, 1990 .

Full polarization measurement of synchrotron radiation with use of soft x‐ray multilayers

Masaki Yamamoto, Hiroaki Kimura, Mihiro Yanagihara, 1992 .

Optical constants of very thin Pt and Rh films determined from soft-X-ray reflectance and photoelectric yield measurements

M. Yanagihara, T. Namioka, Masaki Yamamoto, 1993 .