H. Ebel

发表

Quantitative surface analysis by XPS and XAS

H. Ebel, M. Ebel, H. Krocza, 1988 .

Comparison of electron attenuation lengths and escape depths with inelastic mean free paths

A. Jablonski, H. Ebel, 1988 .

Numerical description of photoelectric absorption coefficients for fundamental parameter programs

John H. Hubbell, J. H. Hubbell, Horst Ebel, 2003 .

An Electron Spectroscopic Investigation of Attenuation Lengths of Electrons in SiO2 in the Energy Range 450 eV ≤ Ekin ≤ 3100 eV

H. Ebel, M. Ebel, R. Svagera, 1992 .

X-Ray Fluorescence Analysis (XRF) in Europe

H. Ebel, 1987 .

Quantitative analysis by X-ray induced total electron yield (TEY) compared to XRFA

H. Ebel, 2004, Powder Diffraction.

Experimental evidence for secondary excitation in X-ray photoelectron spectrometry

C. V. D. Marel, P. Zalm, H. Ebel, 2003 .

L?, L?1,2, L?, L?1,2,3,4,5,6 and L?1,2,3 spectra of x-ray tubes

H. Ebel, 2003 .

Multiple ionization in quantitative XRF

H. Ebel, M. Ebel, R. Svagera, 2001 .

Surface analysis by TEY — Theory and applications

H. Ebel, M. Ebel, R. Svagera, 1997 .

Total Electron Yield (TEY) A New Approach for Quantitative X-ray Analysis

H. Ebel, M. Ebel, R. Svagera, 1994 .

Determination of thickness and composition of thin Al{sub x}Ga{sub 1-x}As layers on GaAs by total electron yield (TEY)

M. Mantler, H. Ebel, M. Ebel, 1995 .

ON THE ENERGY DEPENDENCE OF THE DETECTOR EFFICIENCY OF A Si-PIN DIODE

P. Wobrauschek, B. Wernsperger, M. Mantler, 2000 .

Depth Profiling by Means of X-Ray Fluorescence Analysis

S. Afshar, H. Ebel, R. Svagera, 1991 .

μ/ρ Algorithm valid for 1 keV ≤ E ≤ 50 keV and 11 ≤ Z ≤ 83

H. Ebel, J. Wernisch, C. Pöhn, 1984 .

Application of the method of variable take-off angle to rapid quantitative XRFA with energy dispersive systems

H. Ebel, S. Drabseh, 1975 .

Influence of concentration gradients and surface roughness on measured reduced thicknesses of overlayers

G. Moser, A. Jablonski, H. Oppolzer, 1987 .

On the energy dependence of attenuation lengths in hydrocarbon contaminations

H. Ebel, M. Ebel, R. Svagera, 1991 .

The energy dependence of attenuation lengths in elements

A. Jablonski, H. Ebel, M. Ebel, 1988 .

Film thicknesses determined by X-ray photoelectron spectroscopy

A. Jablonski, H. Ebel, M. Ebel, 1984 .

Reduced thickness of contamination layers determined from C 1s- and CKVV-lines

H. Ebel, M. Ebel, M. Schmid, 1984 .

Quantitative analysis by X-ray photoelectron spectroscopy witout reference samples

K. Hirokawa, H. Ebel, M. Ebel, 1982 .

Calibration of an X-ray photoelectron spectrometer by means of noble metals

H. Ebel, M. Ebel, J. Wernisch, 1983 .

A comparison of two XPS methods for quantification of concentration profiles

P. Varga, H. Ebel, M. Ebel, 1991 .

Quantitative surface analysis performed with an imaging photoelectron spectrometer

M. Mantler, H. Ebel, M. Ebel, 1990 .

Quantitative surface analysis by X-ray photoelectron spectroscopy and X-ray excited auger electron spectroscopy

H. Ebel, M. Ebel, 1990 .

Effects of photoelectron elastic scattering on angular distribution of photoemission from solids

H. Ebel, M. Ebel, Alexander Jalonski, 1986 .

X-ray analysis of thin GexCyOz: H films

F. Olcaytug, J. Schalko, A. Jachimowicz, 1992 .

Calculation of escape depths from inelastic mean free paths

M. E. Wernle, A. Jablonski, H. Ebel, 1990 .

Magnesium enrichment on the surface of aluminium foils

H. Ebel, M. Ebel, J. Wernisch, 1988 .

Mössbauer study of mixed-ligand complexes of europium(III)

E. Kuzmann, J. Kiss, K. Burger, 1990 .

Measurements of the temperature dependence of the lattice parameters of some rare earth compounds with zircon structure

W. Urban, H. Ebel, H. Schopper, 1972 .

Interpretation of ghost lines in secondary-electron spectra determined by XPS

J. Finster, N. Gurker, H. Ebel, 1982 .

On the influence of surface-roughness on X-ray photoelectron intensities

H. Ebel, M. Ebel, E. Hillbrand, 1973 .

Photoelectron spectrometric investigations of thin gold films evaporated onto glass

H. Ebel, M. Ebel, 1972 .

Analogies between quantitative X‐ray fluorescence analysis (XRFA) and quantitative X‐ray photoelectron spectrometry (XPS)

H. Ebel, M. Ebel, 1973 .

Quantitative analysis by XPS using the multiline approach

S. Tougaard, A. Jablonski, B. Lesiak, 1994 .

XPS/ESCA applied to quick-frozen solutions I.- A study of nitrogen compounds in aqueous solutions

K. Burger, H. Ebel, F. Tschismarov, 1977 .

X-ray tube spectra

Horst Ebel, H. Ebel, 1999 .

Spectra of X-Ray Tubes with Transmission Anodes for Fundamental Parameter Analysis

H. Ebel, M. Ebel, C. Pöhn, 1992 .

An x‐ray spectrometer with a position‐sensitive wire detector (PSD)

N. Gurker, M. Mantler, H. Ebel, 1983 .

Imaging XPS. A Contribution to 3D X-ray Analysis

M. Mantler, H. Ebel, M. Ebel, 1990 .

Experiments on imaging X‐ray analytical methods

M. Bavdaz, N. Gurker, H. Ebel, 1989 .

Crystallographic study on metal sulphide-active material for cadmium ion-selective electrodes

E. Pungor, M. Farkas-Jahnke, H. Ebel, 1986 .

Surface studies on precipitate-based cyanide electrodes

L. Pólos, E. Pungor, M. Gratzl, 1984 .

About the charging effect in X-ray photoelectron spectrometry

H. Ebel, M. Ebel, 1974 .

X-ray fluorescence analysis without standards

M. Mantler, H. Ebel, 1980 .

The effect of spin states of iron[II] on the XPS of its mixed complexes

K. Burger, H. Ebel, K. Madeja, 1982 .

XPS study of low-spin cobalt(III) mixed ligand complexes

C. Várhelyi, K. Burger, H. Ebel, 1984 .

XPS(ESCA) characterization of spin-state crossover in an iron(II) mixed complex

K. Burger, H. Ebel, 1981 .

Imaging XPS—A new technique, I—principles

Horst Ebel, Maria F. Ebel, N. Gurker, 1983 .

Determination of the thickness of SiO2 layers on SI by X-ray spectrometry

H. Ebel, M. Ebel, J. Wernisch, 1980 .

On the influence of elastic scattering on asymmetric xp-signal distribution

Horst Ebel, Maria F. Ebel, A. Jablonski, 1985 .

Quantification of continuous and characteristic tube spectra for fundamental parameter analysis

H. Ebel, M. Ebel, J. Wernisch, 1989 .

Comparison of Various Descriptions of X-Ray Tube Spectra

H. Ebel, J. Wernisch, B. Schossmann, 1995 .

Description of x-ray tube spectra by the depth distribution function of Pouchou and Pichoir

H. Ebel, J. Wernisch, B. Schobmann, 1994 .

An Algorithm for the Description of White and Characteristic Tube Spectra (11 ≤ Z ≤ 83, 10keV ≤ Eo ≤ 50keV)

H. Ebel, J. Wernisch, P. Pella, 1991 .

Effects of elastic photoelectron collisions in quantitative XPS

A. Jablonski, H. Ebel, 1984 .

Update of photoelectric absorption coefficients in the tables of McMaster

A. Shaltout, H. Ebel, R. Svagera, 2006 .

Excitation of KLL‐auger spectra by white X‐radiation

P. Ettmayer, H. Ebel, M. Ebel, 1988 .

A Fast Algorithm for Fundamental Parameter Calculations

Ch. Pöhn, Horst Ebel, H. Ebel, 1991 .

Quantitative XPS — multiline approach

Wolfgang Hanke, Kichinosuke Hirokawa, Horst Ebel, 1986 .

Investigation of concentration depth profiles by means of angle-resolved XPS: A polynomial model

M. Grabherr, G. Baron, H. Ebel, 1993 .

Quantitative X-Ray Fluorescence Analysis With Variable Take-Off Angle

H. Ebel, 1969 .

Imaging XPS with a hemispherical analyzer and multichannelplate detection

N. Gurker, M. Mantler, H. Ebel, 1990 .

Study on electromagnetron for plasma polymerization. II. Magnetic field enhanced radio frequency plasma deposition of organogermanium films from tetraethylgermanium

F. Olcaytug, H. Yasuda, J. Schalko, 1994 .