Štefan Lányi

Scanning tip measurement for identification of point defects

Filippo Giannazzo, László Dózsa, György Molnár, 2011, Nanoscale research letters.

Linearization of inverse-capacitance-based displacement transducers

Miloslav Hruskovic, Štefan Lányi, 2001 .

Analysis of linearity errors of inverse capacitance position sensors

Štefan Lányi, 1998 .

Improved wide-range bimorph scanners

Štefan Lányi, Milan Ožvold, 1992 .