David L. DeMaris

Automated sample plan selection for OPC modeling

Andreas Krause, Maria Gabrani, Om Jaiswal, 2014, Advanced Lithography.

Visualization in a VLSI design automation system

David L. DeMaris, 1991, IBM J. Res. Dev..

An information retrieval system for the analysis of systematic defects in VLSI

Dan Maynard, David L. DeMaris, Shi Zhong, 2004, 16th IEEE International Conference on Tools with Artificial Intelligence.

Fast source independent estimation of lithographic difficulty supporting large scale source optimization

Kafai Lai, Maria Gabrani, Ronald P. Luijten, 2012, Advanced Lithography.