C. H. van Niekerk

Detecting variations of small-signal equivalent-circuit model parameters in the Si/SiGe HBT process with ANN: Research Articles

Bart Nauwelaers, Dominique Schreurs, Renaud Gillon, 2005 .

A new hybrid multibias analytical/decomposition-based FET parameter extraction algorithm with intelligent bias point selection

Dominique Schreurs, C. H. van Niekerk, J. A. du Preez, 2003 .

A NEW APPROACH FOR THE EXTRACTION OF AN FET EQUIVALENT CIRCUIT FROM MEASURED S PARAMETERS

Petrie Meyer, C. H. van Niekerk, 1996 .

Performance and limitations of decomposition-based parameter extraction procedures for FET small-signal models

Petrie Meyer, C. H. van Niekerk, 1998 .

Development of extraction and optimization based large‐signal models for thinned metamorphic high‐electron mobility transistors on germanium

Dominique Schreurs, G. Borghs, C. H. van Niekerk, 2002 .

Detecting variations of small‐signal equivalent‐circuit model parameters in the Si/SiGe HBT process with ANN

Dominique Schreurs, Bart Nauwelaers, Renaud Gillon, 2005 .

A robust integrated multibias parameter-extraction method for MESFET and HEMT models

Dominique Schreurs, Petrie Meyer, C. H. van Niekerk, 2000 .