Denis Buttard

High-energy x-ray reflectivity of buried interfaces created by wafer bonding

Bernard Aspar, Hubert Moriceau, Frank Fournel, 2001 .

Dislocation strain field in ultrathin bonded silicon wafers studied by grazing incidence x-ray diffraction

Hubert Moriceau, D. Lübbert, Frank Fournel, 2002 .

Epitaxial growth of germanium dots on Si(001) surface covered by a very thin silicon oxide layer

D. Buttard, J. Rouviere, A. Barski, 2000 .