Takashi Yamazaki

Neutron-Induced Multiple-Cell Upsets in 20-nm Bulk SRAM: Angular Sensitivity and Impact of Multiwell Potential Perturbation

Noriaki Saito, Hideya Matsuyama, Takashi Kato, 2019, IEEE Transactions on Nuclear Science.

Origin analysis of thermal neutron soft error rate at nanometer scale

Yuji Kataoka, Taiki Uemura, Takeshi Soeda, 2015 .