Shah Jahinuzzaman

Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors

Jyothi Velamala, Norbert Seifert, Jeffrey Hicks, 2015, IEEE Transactions on Nuclear Science.

On the efficacy of using proton beams for estimating neutron-induced soft error rates

Adam Neale, Norbert Seifert, Samwel Sekwao, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).