Ricardo Ascazubi
发表
Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors
Jyothi Velamala,
Norbert Seifert,
Jeffrey Hicks,
2015,
IEEE Transactions on Nuclear Science.
Carl Shneider,
Ingrid Wilke,
Partha S. Dutta,
2005
.
Ingrid Wilke,
Partha S. Dutta,
Ricardo Ascazubi,
2006
.
Ingrid Wilke,
Partha S. Dutta,
P. Dutta,
2006
.
Michael S. Shur,
Xiang Zhang,
Jingzhou Xu,
2004
.