P. Marshall

Comparison of pMOSFET total dose response for Co-60 gammas and high-energy protons

R. L. Pease, M. Simons, P. Marshall, 2001 .

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

R. Reed, D. McMorrow, C. Seidleck, 2004, IEEE Transactions on Nuclear Science.

Single event effect and radiation damage results for candidate spacecraft electronics

C. Marshall, R.A. Reed, C.M. Seidleck, 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).