Rihito Kuroda

发表

A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

Rihito Kuroda, Akihiro Yonezawa, Akinobu Teramoto, 2013, IEEE Transactions on Electron Devices.

Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction

Rihito Kuroda, Akinobu Teramoto, Kazufumi Watanabe, 2007, Microelectron. Reliab..

A linear response single exposure CMOS image sensor with 0.5e− readout noise and 76ke− full well capacity

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015, 2015 Symposium on VLSI Circuits (VLSI Circuits).

A 20 Mfps Global Shutter CMOS Image Sensor with Improved Sensitivity and Power Consumption

Rihito Kuroda, Shigetoshi Sugawa, Tohru Takeda, 2015 .

A Highly Robust Silicon Ultraviolet Selective Radiation Sensor Using Differential Spectral Response Method †

Rihito Kuroda, Shigetoshi Sugawa, Yhang Ricardo Sipauba Carvalho da Silva, 2019, Sensors.

[Paper] A CMOS Image Sensor with 240 μV/e– Conversion Gain, 200 ke– Full Well Capacity, 190-1000 nm Spectral Response and High Robustness to UV light

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

[Paper] Floating Capacitor Load Readout Operation for Small, Low Power Consumption and High S/N Ratio CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

Analysis of the Breakdown Voltage of an Area Surrounded by the Multi-trench Gaps in a 4kV Monolithic Isolator for a Communication Network Interface

Rihito Kuroda, Shigetoshi Sugawa, Yusuke Takeuchi, 2014 .

New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry

Rihito Kuroda, Tsung-Ling Li, Shigetoshi Sugawa, 2013, Electronic Imaging.

[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .

A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor

Rihito Kuroda, Shigetoshi Sugawa, Manabu Suzuki, 2018 .

A robust color signal processing with wide dynamic range WRGB CMOS image sensor

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2011, Electronic Imaging.

High Speed and Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems

Yosei Shibata, Takahiro Ishinabe, Hideo Fujikake, 2018, IEICE Trans. Electron..

Measurement and Analysis of Seismic Response in Semiconductor Manufacturing Equipment

Rihito Kuroda, Shigetoshi Sugawa, Kaori Komoda, 2015, IEEE Transactions on Semiconductor Manufacturing.

Pixel Structure of Ultra-High Speed CMOS Image Sensor with 20Mfps

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2014 .

Circuit level prediction of device performance degradation due to negative bias temperature stress

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007, Microelectron. Reliab..

High Performance and Highly Reliable Novel CMOS Devices Using Accumulation Mode Fully Depleted SOI MOSFETs

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2006 .

Color reproductivity improvement with additional virtual color filters for WRGB image sensor

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2013, Electronic Imaging.

Photodiode dopant structure with atomically flat Si surface for high-sensitivity and stability to UV light

Rihito Kuroda, Shigetoshi Sugawa, Taiki Nakazawa, 2012, Electronic Imaging.

[Paper] A 20Mfps Global Shutter CMOS Image Sensor with Improved Light Sensitivity and Power Consumption Performances

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2016 .

[Paper] Preserved Color Pixel: high-resolution and high-colorfidelity image acquisition using single image sensor with sub-half-micron pixels

Rihito Kuroda, Shigetoshi Sugawa, Yuichiro Yamashita, 2020 .

Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with Pixel-wise Trench Capacitor Memory Array †

Rihito Kuroda, Manabu Suzuki, Shigetoshi Sugawa, 2020, Sensors.

A 1024×1 linear photodiode array sensor with fast readout speed flexible pixel-level integration time and high stability to UV light exposure

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2014, Electronic Imaging.

A CMOS Image Sensor Using Column-Parallel Forward Noise-Canceling Circuitry

Rihito Kuroda, Tsung-Ling Li, Shigetoshi Sugawa, 2013 .

A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016, 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits).

A statistical evaluation of effective time constants of random telegraph noise with various operation timings of in-pixel source follower transistors

Rihito Kuroda, Akinobu Teramoto, A. Yonezawa, 2014, Electronic Imaging.

Image Electronics Information Sensing

Takayuki Hamamoto, Rihito Kuroda, Masayuki Ikebe, 2008 .

[Papers] A Multi Spectral Imaging System with a 71dB SNR 190-1100 nm CMOS Image Sensor and an Electrically Tunable Multi Bandpass Filter

Takahiro Ishinabe, Hideo Fujikake, Rihito Kuroda, 2018 .

A global-shutter CMOS image sensor with readout speed of 1Tpixel/s burst and 780Mpixel/s continuous

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2012, 2012 IEEE International Solid-State Circuits Conference.

Si image sensors with wide spectral response and high robustness to ultraviolet light exposure

Rihito Kuroda, Shigetoshi Sugawa, 2014, IEICE Electron. Express.

A statistical evaluation of low frequency noise of in-pixel source follower-equivalent transistors with various channel types and body bias

Rihito Kuroda, Akinobu Teramoto, Tsung-Ling Li, 2013, Electronic Imaging.

[Paper] A Highly Ultraviolet Light Sensitive and Highly Robust Image Sensor Technology Based on Flattened Si Surface

Rihito Kuroda, Shigetoshi Sugawa, Satoshi Nasuno, 2014 .

[Paper] A High Quantum Efficiency High Readout Speed 1024 Pixel Ultraviolet-Visible-Near Infrared Waveband Photodiode Array

Rihito Kuroda, Shigetoshi Sugawa, Kenji Takubo, 2016 .

Analysis of pixel gain and linearity of CMOS image sensor using floating capacitor load readout operation

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015, Electronic Imaging.

Pixel Scaling in CMOS Image Sensors with Lateral Overflow Integration Capacitor

Yoshiaki Tashiro, Rihito Kuroda, Shun Kawada, 2009 .

Image electronics: Information sensing

Takashi Tokuda, Takayuki Hamamoto, Rihito Kuroda, 2008 .

A Global-Shutter CMOS Image Sensor With Readout Speed of 1-Tpixel/s Burst and 780-Mpixel/s Continuous

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2013, IEEE Journal of Solid-State Circuits.

Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2009, IEICE Trans. Electron..

An Optical Filter-Less CMOS Image Sensor with Differential Spectral Response Pixels for Simultaneous UV-Selective and Visible Imaging †

Rihito Kuroda, Yhang Ricardo Sipauba Carvalho da Silva, Shigetoshi Sugawa, 2019, Sensors.

Accurate negative bias temperature instability lifetime prediction based on hole injection

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2008, Microelectron. Reliab..

A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).

Ultra-high speed video capturing of time dependent dielectric breakdown of metal-oxide-silicon capacitor up to 10M frame per second

Rihito Kuroda, Yasuhisa Tochigi, Tohru Takeda, 2014, Electronic Imaging.

19-8 Over-10Mfps Images Using a High-Speed CMOS Image Sensor

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2012 .

Random telegraph noise measurement and analysis based on arrayed test circuit toward high S/N CMOS image sensors

Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa, 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS).

UV/VIS/NIR imaging technologies: challenges and opportunities

Rihito Kuroda, Shigetoshi Sugawa, 2015, Commercial + Scientific Sensing and Imaging.

[Paper] Analysis and Reduction Technologies of Floating Diffusion Capacitance in CMOS Image Sensor for Photon-Countable Sensitivity

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

Cameras with On-chip Memory CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, 2018 .

Pixel structure with 10 nsec fully charge transfer time for the 20m frame per second burst CMOS image sensor

Rihito Kuroda, Yasuhisa Tochigi, Yasushi Kondo, 2014, Electronic Imaging.

A UV Si-photodiode with almost 100% internal Q.E. and high transmittance on-chip multilayer dielectric stack

Rihito Kuroda, Taiki Nakazawa, Yasumasa Koda, 2013, Electronic Imaging.

High performance accumulation mode FD-SOI MOSFETs on Si(110) and (110) surfaces (シリコン材料・デバイス)

Rihito Kuroda, Akinobu Teramoto, Tadahiro Ohmi, 2007 .

A prototype high-speed CMOS image sensor with 10,000,000 fps burst-frame rate and 10,000 fps continuous-frame rate

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2011, Electronic Imaging.

A pixel-shared CMOS image sensor using lateral overflow gate

Rihito Kuroda, Shigetoshi Sugawa, Nana Akahane, 2009, 2009 Proceedings of ESSCIRC.

[Papers] Impacts of Random Telegraph Noise with Various Time Constants and Number of States in Temporal Noise of CMOS Image Sensors

Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa, 2018 .

[Invite Paper] High Accuracy High Spatial Resolution and Real-Time CMOS Proximity Capacitance Image Sensor Technology and its Applications

Rihito Kuroda, Shigetoshi Sugawa, Watanabe Yoshiaki, 2021 .

A Proposal of Analog Correlated Multiple Sampling with High Density Capacitors for Low Noise CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunta Kamoshita, 2021, Electronic Imaging.

Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2010, 2010 IEEE International Reliability Physics Symposium.

Ultra-high Speed Image Sensors for Scientific Imaging

Rihito Kuroda, Yasuhisa Tochigi, Ken Miyauchi, 2013 .

A Wide Dynamic Range CMOS Image Sensor with 200-1100 nm Spectral Sensitivity and High Robustness to Ultraviolet Light Exposure

Rihito Kuroda, Satoshi Nasuno, S. Sugawa, 2013 .

Low Temperature Atomically Flattening of Si Surface of Shallow Trench Isolation Pattern

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2015 .

A Study on Very High Performance Novel Balanced Fully Depleted Silicon-on-Insulator Complementary Metal–Oxide–Semiconductor Field-Effect Transistors on Si(110) Using Accumulation-Mode Device Structure for Radio-Frequency Analog Circuits

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2009 .

NBTI Mechanism Based on Hole-Injection for Accurate Lifetime Prediction

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007 .

Recovery Characteristic of Anomalous Stress Induced Leakage Current of 5.6nm Oxide Films

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2011 .

Extraction of time constants ratio over nine orders of magnitude for understanding random telegraph noise in metal–oxide–semiconductor field-effect transistors

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2014 .

Ultra-low series resistance W/ErSi2/n+-Si and W/Pd2Si/p+-Si S/D electrodes for advanced CMOS platform

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2010, 2010 International Electron Devices Meeting.

Complementary Metal–Oxide–Silicon Field-Effect-Transistors Featuring Atomically Flat Gate Insulator Film/Silicon Interface

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2009 .

Impact of Random Telegraph Noise Reduction with Buried Channel MOSFET

Tadahiro Ohmi, Rihito Kuroda, S. Sugawa, 2011 .

Analysis of the Low-Frequency Noise Reduction in Si(100) Metal–Oxide–Semiconductor Field-Effect Transistors

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2011 .

The data analysis technique of the atomic force microscopy for the atomically flat silicon surface(Session9A: Silicon Devices IV)

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2008, SDM 2008.

High quantum efficiency 200–1000 nm spectral response photodiodes with on-chip multiple high transmittance optical layers

Rihito Kuroda, Shigetoshi Sugawa, Yasumasa Koda, 2014, IEEE SENSORS 2014 Proceedings.

A 80 % QE High Readout Speed 1024 Pixel Linear Photodiode Array for UV-VIS-NIR Spectroscopy

Rihito Kuroda, Shigetoshi Sugawa, Kenji Takubo, 2015 .

High Quality and Low Thermal Budget Silicon Nitride Deposition Using PECVD for Gate Spacer, Silicide Block and Contact Etch Stopper

Tadahiro Ohmi, Hironori Tanaka, Rihito Kuroda, 2011 .

Development of NBTI Lifetime Prediction Method and Evaluation Method using Hole Injection Technique

Tadahiro Ohmi, Rihito Kuroda, S. Sugawa, 2005 .

Impact of Channel Direction Dependent Low Field Hole Mobility on (100) Orientation Silicon Surface

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2011 .

Atomically Flattening Technology at 850ºC for Si(100) Surface

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2019, ECS Transactions.

A 20 Mfps Global Shutter CMOS Image Sensor with Improved Light Sensitivity and Power Consumption Performances

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2016 .

High performance and highly reliable novel CMOS devices using accumulation mode multi-gate and fully depleted SOI MOSFETs

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007 .

A Test Circuit for Extremely Low Gate Leakage Current Measurement of 10 aA for 80 000 MOSFETs in 80 s

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2013 .

A CMOS Image Sensor with 240 μ V / e-Conversion Gain , 200 ke-Full Well Capacity and 190-1000 nm Spectral Response

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015 .

Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .

A wide dynamic range checkered-color CMOS image sensor with IR-Cut RGB and visible-to-near-IR pixels

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2009, 2009 IEEE Sensors.

A wide dynamic range CMOS image sensor with 200–1100 nm spectral sensitivity and high robustness to UV right exposure

Rihito Kuroda, Shigetoshi Sugawa, Satoshi Nasuno, 2014 .

Hot Carrier Instability Mechanism in Accumulation-Mode Normally-off SOI nMOSFETs and Their Reliability Advantage

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2007 .

Large-Scale Test Circuits for High-Speed and Highly Accurate Evaluation of Variability and Noise in Metal–Oxide–Semiconductor Field-Effect Transistor Electrical Characteristics

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2011 .

A novel analysis of oxide breakdown based on dynamic observation using ultra-high speed video capturing up to 10,000,000 frames per second

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2014, 2014 IEEE International Reliability Physics Symposium.

Publisher’s Note: “A wide dynamic range CMOS image sensor with 200–1100 nm spectral sensitivity and high robustness to UV right exposure”

Rihito Kuroda, Shigetoshi Sugawa, Satoshi Nasuno, 2014 .

Extraction of Time Constants Ratio over Nine Orders of Magnitude for Understanding Random Telegraph Noise in MOSFETs

Tadahiro Ohmi, Rihito Kuroda, S. Sugawa, 2013 .

Analysis of Source Follower Random Telegraph Signal Using nMOS and pMOS Array TEG

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2007 .

Pixel Scaling in Complementary Metal Oxide Silicon Image Sensor with Lateral Overflow Integration Capacitor

Yoshiaki Tashiro, Rihito Kuroda, Shigetoshi Sugawa, 2010 .

Analyzing correlation between multiple traps in RTN characteristics

Tadahiro Ohmi, Rihito Kuroda, Akihiro Yonezawa, 2014, 2014 IEEE International Reliability Physics Symposium.