Akihiro Yonezawa

A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

Rihito Kuroda, Akihiro Yonezawa, Akinobu Teramoto, 2013, IEEE Transactions on Electron Devices.

Analyzing correlation between multiple traps in RTN characteristics

Tadahiro Ohmi, Rihito Kuroda, Akihiro Yonezawa, 2014, 2014 IEEE International Reliability Physics Symposium.