Shigetoshi Sugawa

发表

A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

Rihito Kuroda, Akihiro Yonezawa, Akinobu Teramoto, 2013, IEEE Transactions on Electron Devices.

A linear response single exposure CMOS image sensor with 0.5e− readout noise and 76ke− full well capacity

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015, 2015 Symposium on VLSI Circuits (VLSI Circuits).

A 20 Mfps Global Shutter CMOS Image Sensor with Improved Sensitivity and Power Consumption

Rihito Kuroda, Shigetoshi Sugawa, Tohru Takeda, 2015 .

A Highly Robust Silicon Ultraviolet Selective Radiation Sensor Using Differential Spectral Response Method †

Rihito Kuroda, Shigetoshi Sugawa, Yhang Ricardo Sipauba Carvalho da Silva, 2019, Sensors.

[Paper] A CMOS Image Sensor with 240 μV/e– Conversion Gain, 200 ke– Full Well Capacity, 190-1000 nm Spectral Response and High Robustness to UV light

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

[Paper] Floating Capacitor Load Readout Operation for Small, Low Power Consumption and High S/N Ratio CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

Analysis of the Breakdown Voltage of an Area Surrounded by the Multi-trench Gaps in a 4kV Monolithic Isolator for a Communication Network Interface

Rihito Kuroda, Shigetoshi Sugawa, Yusuke Takeuchi, 2014 .

New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry

Rihito Kuroda, Tsung-Ling Li, Shigetoshi Sugawa, 2013, Electronic Imaging.

[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .

A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor

Rihito Kuroda, Shigetoshi Sugawa, Manabu Suzuki, 2018 .

A robust color signal processing with wide dynamic range WRGB CMOS image sensor

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2011, Electronic Imaging.

A Wide DR and Linear Response CMOS Image Sensor With Three Photocurrent Integrations in Photodiodes, Lateral Overflow Capacitors, and Column Capacitors

Noriko Ide, Shigetoshi Sugawa, Woonghee Lee, 2008, IEEE J. Solid State Circuits.

High Speed and Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems

Yosei Shibata, Takahiro Ishinabe, Hideo Fujikake, 2018, IEICE Trans. Electron..

Imager device solid state.

Shigetoshi Sugawa, Keizo Miyazaki, 1997 .

Measurement and Analysis of Seismic Response in Semiconductor Manufacturing Equipment

Rihito Kuroda, Shigetoshi Sugawa, Kaori Komoda, 2015, IEEE Transactions on Semiconductor Manufacturing.

Design and Application of Innovative Multi-table and Bond Head Drive System on Thermal Compression Bonder with UPH Over 2000

Shigetoshi Sugawa, Tomonori Nakamura, Shoji Wada, 2018, 2018 IEEE 68th Electronic Components and Technology Conference (ECTC).

A High S/N Ratio CMOS Image Sensor with Real Time Object Categorizing Function

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2004 .

Pixel Structure of Ultra-High Speed CMOS Image Sensor with 20Mfps

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2014 .

An optimum design of the LOFIC CMOS image sensor for high sensitivity, low noise, and high full well capacity

Shigetoshi Sugawa, Woonghee Lee, Nana Akahane, 2008, Electronic Imaging.

Circuit level prediction of device performance degradation due to negative bias temperature stress

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007, Microelectron. Reliab..

High Performance and Highly Reliable Novel CMOS Devices Using Accumulation Mode Fully Depleted SOI MOSFETs

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2006 .

Color reproductivity improvement with additional virtual color filters for WRGB image sensor

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2013, Electronic Imaging.

A photoelectric converter and the same image processing apparatus verwended

Shigetoshi Sugawa, Hiraku Kozuka, Ihachiro Gofuku, 1992 .

Photodiode dopant structure with atomically flat Si surface for high-sensitivity and stability to UV light

Rihito Kuroda, Shigetoshi Sugawa, Taiki Nakazawa, 2012, Electronic Imaging.

Statistical Evaluation of Process Damage Using an Arrayed Test Pattern in a Large Number of MOSFETs

Tadahiro Ohmi, Naoto Miyamoto, Akinobu Teramoto, 2010, IEEE Transactions on Electron Devices.

Checker-pattern and shared two pixels LOFIC CMOS image sensors

Yoshiaki Tashiro, Shigetoshi Sugawa, Shun Kawada, 2010, 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC).

[Paper] A 20Mfps Global Shutter CMOS Image Sensor with Improved Light Sensitivity and Power Consumption Performances

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2016 .

A linear response 200-dB dynamic range CMOS image sensor with multiple voltage and current readout operations

Noriko Ide, Shigetoshi Sugawa, Nana Akahane, 2008, Electronic Imaging.

A 800(H) x 600(V) high sensitivity and high full well capacity CMOS image sensor with active pixel readout feedback operation

Shigetoshi Sugawa, Satoru Adachi, Woonghee Lee, 2008, Electronic Imaging.

A still-image encoder based on adaptive resolution vector quantization featuring needless calculation elimination architecture

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2003 .

A 1024×1 linear photodiode array sensor with fast readout speed flexible pixel-level integration time and high stability to UV light exposure

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2014, Electronic Imaging.

A photoelectric converter and image processing device that makes use of this

Shigetoshi Sugawa, Ihachiro Gofuku, 1992 .

A CMOS Image Sensor Using Column-Parallel Forward Noise-Canceling Circuitry

Rihito Kuroda, Tsung-Ling Li, Shigetoshi Sugawa, 2013 .

A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016, 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits).

A 960-fps sub-sampling object extraction CMOS image sensor with 12-bit column parallel ADCs and ALUs

Shigetoshi Sugawa, Takashi Kubo, Tomoyasu Tate, 2007, Electronic Imaging.

A low-noise wide dynamic range CMOS image sensor with low and high temperatures resistance

Shigetoshi Sugawa, Satoru Adachi, Nana Akahane, 2008, Electronic Imaging.

A global-shutter CMOS image sensor with readout speed of 1Tpixel/s burst and 780Mpixel/s continuous

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2012, 2012 IEEE International Solid-State Circuits Conference.

A still image encoder based on adaptive resolution vector quantization employing needless calculation elimination architecture

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2003, ASP-DAC '03.

Si image sensors with wide spectral response and high robustness to ultraviolet light exposure

Rihito Kuroda, Shigetoshi Sugawa, 2014, IEICE Electron. Express.

A statistical evaluation of low frequency noise of in-pixel source follower-equivalent transistors with various channel types and body bias

Rihito Kuroda, Akinobu Teramoto, Tsung-Ling Li, 2013, Electronic Imaging.

Active matrix type liquid crystal display element and its production

Shigetoshi Sugawa, 須川成利, 光地哲伸, 1992 .

High quality silicon nitride deposited by Ar/N2/H2/SiH4 high-density and low energy plasma at low temperature

Tadahiro Ohmi, Hiroaki Tanaka, Shigetoshi Sugawa, 2006, Microelectron. J..

[Paper] A Highly Ultraviolet Light Sensitive and Highly Robust Image Sensor Technology Based on Flattened Si Surface

Rihito Kuroda, Shigetoshi Sugawa, Satoshi Nasuno, 2014 .

A Wide Dynamic Range CMOS Image Sensor with Improved Heat-Resistance and Image Quality at High Temperatures

Shigetoshi Sugawa, Nana Akahane, Koichi Mizobuchi, 2008 .

Analysis of pixel gain and linearity of CMOS image sensor using floating capacitor load readout operation

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015, Electronic Imaging.

Checkered White-RGB Color LOFIC CMOS image sensor

Yoshiaki Tashiro, Shigetoshi Sugawa, Shun Kawada, 2010, 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC).

Impact of High Performance Accumulation-Mode Fully Depleted SOI MOSFETs (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2005 .

Experiment and device simulation for photo-electron overflow characteristics on a pixel-shared CMOS image sensor using lateral overflow gate

Yoshiaki Tashiro, Shigetoshi Sugawa, Shin Sakai, 2010, Electronic Imaging.

A Global-Shutter CMOS Image Sensor With Readout Speed of 1-Tpixel/s Burst and 780-Mpixel/s Continuous

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2013, IEEE Journal of Solid-State Circuits.

Accurate negative bias temperature instability lifetime prediction based on hole injection

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2008, Microelectron. Reliab..

A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).

The role of the temperature on the scattering mechanisms limiting the electron mobility in metal-oxide-semiconductor field-effect-transistors fabricated on (110) silicon-oriented wafers

Tadahiro Ohmi, Akinobu Teramoto, Shigetoshi Sugawa, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

A Mulitiple-Exposure, Linear Response, Wide-Dynamic-Range CMOS Image Sensor Combining Electric-charge Voltage Conversions in Pixel Capacitor and Column Capacitor

Noriko Ide, Shigetoshi Sugawa, Nana Akahane, 2010 .

Pixel Scaling Technology in LOFIC CMOS Image Sensor

Yoshiaki Tashiro, Shigetoshi Sugawa, Shun Kawada, 2010 .

19-8 Over-10Mfps Images Using a High-Speed CMOS Image Sensor

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2012 .

Random telegraph noise measurement and analysis based on arrayed test circuit toward high S/N CMOS image sensors

Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa, 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS).

Complementary mis-component-

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2002 .

High-speed and highly accurate evaluation of electrical characteristics in MOSFETs

Tadahiro Ohmi, Akinobu Teramoto, Shigetoshi Sugawa, 2013, Proceedings of 2013 International Conference on IC Design & Technology (ICICDT).

High quality gate insulator film formation on SiC using by microwave-excited high-density plasma

Tadahiro Ohmi, Hiroaki Tanaka, Akinobu Teramoto, 2007, Microelectron. Reliab..

UV/VIS/NIR imaging technologies: challenges and opportunities

Rihito Kuroda, Shigetoshi Sugawa, 2015, Commercial + Scientific Sensing and Imaging.

A CMOS image sensor with 2.5-e− random noise and 110-ke− full well capacity using column source follower readout circuits

Shigetoshi Sugawa, Woonghee Lee, Koichi Mizobuchi, 2009, 2009 Symposium on VLSI Circuits.

[Paper] Analysis and Reduction Technologies of Floating Diffusion Capacitance in CMOS Image Sensor for Photon-Countable Sensitivity

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2016 .

Power Efficiency Figure of Merit for Image Sensors

Shigetoshi Sugawa, Yuichiro Yamashita, 2019, IEEE Transactions on Electron Devices.

A Rapid Prototyping of Real-Time Pattern Generator for Step-and-Scan Lithography Using Digital Micromirror Device

Tadahiro Ohmi, Naoto Miyamoto, Shigetoshi Sugawa, 2007, 2007 International Conference on Field-Programmable Technology.

Cameras with On-chip Memory CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, 2018 .

An Over 200-dB Dynamic Range CMOS Image Sensor Combining a Lateral Overflow Integration with Photo-Current Readout Operation

Noriko Ide, Shigetoshi Sugawa, Koichi Mizobuchi, 2007 .

A temperature-resistant wide-dynamic-range CMOS image sensor

Shigetoshi Sugawa, Satoru Adachi, Nana Akahane, 2007, Electronic Imaging.

A prototype high-speed CMOS image sensor with 10,000,000 fps burst-frame rate and 10,000 fps continuous-frame rate

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2011, Electronic Imaging.

A pixel-shared CMOS image sensor using lateral overflow gate

Rihito Kuroda, Shigetoshi Sugawa, Nana Akahane, 2009, 2009 Proceedings of ESSCIRC.

Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation

Akinobu Teramoto, Shigetoshi Sugawa, Tomoyuki Suwa, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Improving Execution Speed of FPGA using Dynamically Reconfigurable Technique

Koji Kotani, Tadahiro Ohmi, Naoto Miyamoto, 2007, 2007 Asia and South Pacific Design Automation Conference.

[Papers] Impacts of Random Telegraph Noise with Various Time Constants and Number of States in Temporal Noise of CMOS Image Sensors

Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa, 2018 .

[Invite Paper] High Accuracy High Spatial Resolution and Real-Time CMOS Proximity Capacitance Image Sensor Technology and its Applications

Rihito Kuroda, Shigetoshi Sugawa, Watanabe Yoshiaki, 2021 .

A Proposal of Analog Correlated Multiple Sampling with High Density Capacitors for Low Noise CMOS Image Sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunta Kamoshita, 2021, Electronic Imaging.

A sensitivity and linearity improvement of a 100-dB dynamic range CMOS image sensor using a lateral overflow integration capacitor

Shigetoshi Sugawa, Nana Akahane, Koichi Mizobuchi, 2006, IEEE Journal of Solid-State Circuits.

Low frequency noise assessment of accumulation Si p-MOSFETs

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2012 .

The Impact of Factory Managed Inventory(FMI) on Global Supply Chains

Shigetoshi Sugawa, Nobuo Nakatsuka, Masashi Kurahashi, 2010, 2010 International Conference on Management and Service Science.

Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2010, 2010 IEEE International Reliability Physics Symposium.

Low Temperature Atomically Flattening of Si Surface of Shallow Trench Isolation Pattern

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2015 .

A Study on Very High Performance Novel Balanced Fully Depleted Silicon-on-Insulator Complementary Metal–Oxide–Semiconductor Field-Effect Transistors on Si(110) Using Accumulation-Mode Device Structure for Radio-Frequency Analog Circuits

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2009 .

Recovery Characteristic of Anomalous Stress Induced Leakage Current of 5.6nm Oxide Films

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2011 .

A High S/N Ratio Object Extraction CMOS Image Sensor with Column Parallel Signal Processing

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2004 .

A Very Low Dark Current Temperature-Resistant, Wide Dynamic Range, Complementary Metal Oxide Semiconductor Image Sensor

Shigetoshi Sugawa, Nana Akahane, Jose Tejada, 2008 .

New Statistical Evaluation Method for the Variation of Metal–Oxide–Semiconductor Field-Effect Transistors

Tadahiro Ohmi, Shigetoshi Sugawa, S. Watabe, 2007 .

High-Quality Silicon Oxide Film Formed by Diffusion Region Plasma Enhanced Chemical Vapor Deposition and Oxygen Radical Treatment Using Microwave-Excited High-Density Plasma

Yukio Hayakawa, Tadahiro Ohmi, Shigetoshi Sugawa, 2003 .

Extraction of time constants ratio over nine orders of magnitude for understanding random telegraph noise in metal–oxide–semiconductor field-effect transistors

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2014 .

A sensitivity and linearity improvement of a 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor

Shigetoshi Sugawa, Nana Akahane, Koichi Mizobuchi, 2005, VLSIC 2005.

Accurate Temperature Drift model of MOSFETs Mobility for Analog Circuits

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2004 .

A Large-Signal MOSFET Model Based on Transient Carrier Response for RF Circuits

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2004 .

A High Optical Performance 2.8μm BSI LOFIC Pixel with 120ke FWC and 160μV/e Conversion Gain

Shigetoshi Sugawa, Ken Miyauchi, Junichi Nakamura, 2019 .

Ultra-low series resistance W/ErSi2/n+-Si and W/Pd2Si/p+-Si S/D electrodes for advanced CMOS platform

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2010, 2010 International Electron Devices Meeting.

An Over 200 dB Dynamic Range Image Capture using a CMOS Image Sensor with Lateral Overflow Integration Capacitor and Current Readout Circuit in a Pixel

Shigetoshi Sugawa, Nana Akahane, S. Sugawa, 2006 .

High-Speed Damage-Free Contact Hole Etching Using Dual Shower Head Microwave-Excited High-Density-Plasma Equipment

Tadahiro Ohmi, Shigetoshi Sugawa, Takeyoshi Kato, 2004 .

Statistical Analysis of RTS Noise and Low Frequency Noise in 1M MOSFETs Using an Advanced TEG

Tadahiro Ohmi, Naoto Miyamoto, Shigetoshi Sugawa, 2007 .

Image electronics: Information sensing

Takashi Tokuda, Takayuki Hamamoto, Rihito Kuroda, 2008 .

Experimental Investigation of Effect of Channel Doping Concentration on Random Telegraph Signal Noise

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2010 .

Complementary Metal–Oxide–Silicon Field-Effect-Transistors Featuring Atomically Flat Gate Insulator Film/Silicon Interface

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2009 .

A Wide DR and Linear Response CMOS Image Sensor With Three Photocurrent Integrations in Photodiodes, Lateral Overflow Capacitors, and Column Capacitors

Shigetoshi Sugawa, Nana Akahane, Woonghee Lee, 2008, IEEE Journal of Solid-State Circuits.

Hole Mobility in Accumulation Mode Metal--Oxide--Semiconductor Field-Effect Transistors

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2012 .

White–Red–Green–Blue Lateral Overflow Integration Capacitor Complementary Metal–Oxide–Semiconductor Image Sensor with Color-Independent Exposure and Widely-Spectral High Sensitivity

Yoshiaki Tashiro, Shigetoshi Sugawa, Shun Kawada, 2010 .

A color-independent saturation, linear response, wide dynamic range CMOS image sensor with retinal rod- and cone-like color pixels

Shigetoshi Sugawa, Shun Kawada, Nana Akahane, 2009, 2009 Symposium on VLSI Circuits.

A 3 . 25 M-pixel APS-C size CMOS Image Sensor

Shigetoshi Sugawa, Keiichi Higashitani, Shunsuke Inoue, 2008 .

Analysis of the Low-Frequency Noise Reduction in Si(100) Metal–Oxide–Semiconductor Field-Effect Transistors

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2011 .

224-ke Saturation signal global shutter CMOS image sensor with in-pixel pinned storage and lateral overflow integration capacitor

Tadakuni Narabu, Yoshiaki Tashiro, Shigetoshi Sugawa, 2017, 2017 Symposium on VLSI Circuits.

Understanding of traps causing random telegraph noise based on experimentally extracted time constants and amplitude

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2011, 2011 International Reliability Physics Symposium.

A Technology for Reducing Flicker Noise for ULSI Applications

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2003 .

A 310 K pixel bipolar imager (BASIS)

Shigetoshi Sugawa, Mahito Shinohara, Shigeyuki Matsumoto, 1990 .

High quantum efficiency 200–1000 nm spectral response photodiodes with on-chip multiple high transmittance optical layers

Rihito Kuroda, Shigetoshi Sugawa, Yasumasa Koda, 2014, IEEE SENSORS 2014 Proceedings.

LTPS Thin-Film Transistors Fabricated Using New Selective Laser Annealing System

Shigetoshi Sugawa, Tetsuya Goto, Hiroshi Ikenoue, 2018, IEEE Transactions on Electron Devices.

A 80 % QE High Readout Speed 1024 Pixel Linear Photodiode Array for UV-VIS-NIR Spectroscopy

Rihito Kuroda, Shigetoshi Sugawa, Kenji Takubo, 2015 .

Impact of Channel Direction Dependent Low Field Hole Mobility on (100) Orientation Silicon Surface

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2011 .

Atomically Flattening Technology at 850ºC for Si(100) Surface

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2019, ECS Transactions.

A 20 Mfps Global Shutter CMOS Image Sensor with Improved Light Sensitivity and Power Consumption Performances

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2016 .

A High S/N Ratio Object Extraction CMOS Image Sensor with Column Parallel Signal Processing

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2005 .

Formation and Property of Yttrium and Yttrium Silicide Films as Low Schottcky Barrier material for n-Type Silicon

Tadahiro Ohmi, Shigetoshi Sugawa, Tetsuya Goto, 2008 .

Very Low Bit Error Rate in Flash Memory using Tunnel Dielectrics formed by Kr/O2/NO Plasma Oxynitridation

Tadahiro Ohmi, Shigetoshi Sugawa, Yuki Kumagai, 2006 .

A Test Circuit for Extremely Low Gate Leakage Current Measurement of 10 aA for 80 000 MOSFETs in 80 s

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2013 .

A CMOS Image Sensor with 240 μ V / e-Conversion Gain , 200 ke-Full Well Capacity and 190-1000 nm Spectral Response

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2015 .

Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .

A wide dynamic range checkered-color CMOS image sensor with IR-Cut RGB and visible-to-near-IR pixels

Rihito Kuroda, Shigetoshi Sugawa, Shun Kawada, 2009, 2009 IEEE Sensors.

A wide dynamic range CMOS image sensor with 200–1100 nm spectral sensitivity and high robustness to UV right exposure

Rihito Kuroda, Shigetoshi Sugawa, Satoshi Nasuno, 2014 .

Hot Carrier Instability Mechanism in Accumulation-Mode Normally-off SOI nMOSFETs and Their Reliability Advantage

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2007 .

A Complementary Metal–Oxide–Semiconductor Image Sensor with 2.0 e- Random Noise and 110 ke- Full Well Capacity and Noise Measurement of Pixel Transistors Using Column Source Follower Readout Circuits

Shigetoshi Sugawa, Woonghee Lee, Koichi Mizobuchi, 2010 .

Large-Scale Test Circuits for High-Speed and Highly Accurate Evaluation of Variability and Noise in Metal–Oxide–Semiconductor Field-Effect Transistor Electrical Characteristics

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2011 .

A novel analysis of oxide breakdown based on dynamic observation using ultra-high speed video capturing up to 10,000,000 frames per second

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2014, 2014 IEEE International Reliability Physics Symposium.

Publisher’s Note: “A wide dynamic range CMOS image sensor with 200–1100 nm spectral sensitivity and high robustness to UV right exposure”

Rihito Kuroda, Shigetoshi Sugawa, Satoshi Nasuno, 2014 .

MFIS-structure Memory Device with High Quality Ferroelectric Sr2(Ta1-x Nbx)2O7 Formed by Physical Vapor Deposition and Oxygen Radical Treatment by Radical Oxygen Assisted Layer by Layer(ROALL) deposition

Tadahiro Ohmi, Shigetoshi Sugawa, Tetsuya Goto, 2004 .

Analysis of High-Speed Signal Behavior in a Miniaturized Interconnect

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2002 .

Analysis of Source Follower Random Telegraph Signal Using nMOS and pMOS Array TEG

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2007 .

Pixel Scaling in Complementary Metal Oxide Silicon Image Sensor with Lateral Overflow Integration Capacitor

Yoshiaki Tashiro, Rihito Kuroda, Shigetoshi Sugawa, 2010 .

Anomalous Random Telegraph Signal Extractions from a Very Large Number of n-Metal Oxide Semiconductor Field-Effect Transistors Using Test Element Groups with 0.47 Hz–3.0 MHz Sampling Frequency

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2009 .

Asymmetry of RTS characteristics along source-drain direction and statistical analysis of process-induced RTS

Tadahiro Ohmi, Shigetoshi Sugawa, Yuki Kumagai, 2009, 2009 IEEE International Reliability Physics Symposium.

Analyzing correlation between multiple traps in RTN characteristics

Tadahiro Ohmi, Rihito Kuroda, Akihiro Yonezawa, 2014, 2014 IEEE International Reliability Physics Symposium.

Impact of Improved High-Performance Si(110)-Oriented Metal–Oxide–Semiconductor Field-Effect Transistors Using Accumulation-Mode Fully Depleted Silicon-on-Insulator Devices

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2006 .

A Wide Dynamic Range CMOS Image Sensor with Resistance to High Temperatures

Shigetoshi Sugawa, Nana Akahane, Koichi Mizobuchi, 2007 .

GEOMETRY AND BIAS DEPENDENCE OF LOW-FREQUENCY RANDOM TELEGRAPH SIGNAL AND 1/f NOISE LEVELS IN MOSFETS

Tadahiro Ohmi, Shigetoshi Sugawa, L.K.J. Vandamme, 2005 .

Stress-induced leakage current and random telegraph signal

Tadahiro Ohmi, Naoto Miyamoto, Shigetoshi Sugawa, 2009 .